This study deduces numerical and simulation-aided approaches of quality factor affected by intense beam loading in the input cavity. Intense relativistic electron beam loading based on the model of electron density distribution is applied to analyse the particle-microwave interaction. The expression for gap voltage difference in the input cavity between without beam-loading and with it is derived to find out the beam-loaded quality factor. The simulated data by decaying time method of particle-in-cell code being in a good agreement with that attained by the numerical approach are presented. Those presented approaches will be particularly available for a relativistic klystron amplifier with relatively low quality factor and intense relativistic electron beam in the input cavity.
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© The Institution of Engineering and Technology.
All Science Journal Classification (ASJC) codes
- Atomic and Molecular Physics, and Optics
- Electrical and Electronic Engineering