Analysis of transient signatures of arc faults in power distribution systems via time-frequency analysis

Philip Crapse, Jing Jiang Wang, Yong June Shin, Roger Dougal

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper draws on an innovative, signal processing-based method that jointly analyzes the time and frequency domains and uses that information to characterize and distinguish the deadly arc faults from the normal operational faults. This paper introduces a variety of new power quality assessment tools developed with the purpose of both detecting an arc fault faster than has yet been done and distinguishing the arc fault from other normal load operations via time-localized spectral characterization. Based on the time and frequency localization of the arc faults, the time varying impedances of the arc fault are modeled in terms of harmonic sources. The accomplishment of these objectives would lead to new, advanced smart arc fault circuit breakers and the modeling & simulation of arc fault phenomena.

Original languageEnglish
Title of host publicationAdvanced Signal Processing Algorithms, Architectures, and Implementations XVI
DOIs
Publication statusPublished - 2006 Nov 9
EventAdvanced Signal Processing Algorithms, Architectures, and Implementations XVI - San Diego, CA, United States
Duration: 2006 Aug 152006 Aug 16

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6313
ISSN (Print)0277-786X

Other

OtherAdvanced Signal Processing Algorithms, Architectures, and Implementations XVI
CountryUnited States
CitySan Diego, CA
Period06/8/1506/8/16

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Crapse, P., Wang, J. J., Shin, Y. J., & Dougal, R. (2006). Analysis of transient signatures of arc faults in power distribution systems via time-frequency analysis. In Advanced Signal Processing Algorithms, Architectures, and Implementations XVI [63130U] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 6313). https://doi.org/10.1117/12.681925