Abstract
This paper draws on an innovative, signal processing-based method that jointly analyzes the time and frequency domains and uses that information to characterize and distinguish the deadly arc faults from the normal operational faults. This paper introduces a variety of new power quality assessment tools developed with the purpose of both detecting an arc fault faster than has yet been done and distinguishing the arc fault from other normal load operations via time-localized spectral characterization. Based on the time and frequency localization of the arc faults, the time varying impedances of the arc fault are modeled in terms of harmonic sources. The accomplishment of these objectives would lead to new, advanced smart arc fault circuit breakers and the modeling & simulation of arc fault phenomena.
| Original language | English |
|---|---|
| Title of host publication | Advanced Signal Processing Algorithms, Architectures, and Implementations XVI |
| DOIs | |
| Publication status | Published - 2006 Nov 9 |
| Event | Advanced Signal Processing Algorithms, Architectures, and Implementations XVI - San Diego, CA, United States Duration: 2006 Aug 15 → 2006 Aug 16 |
Publication series
| Name | Proceedings of SPIE - The International Society for Optical Engineering |
|---|---|
| Volume | 6313 |
| ISSN (Print) | 0277-786X |
Other
| Other | Advanced Signal Processing Algorithms, Architectures, and Implementations XVI |
|---|---|
| Country | United States |
| City | San Diego, CA |
| Period | 06/8/15 → 06/8/16 |
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All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering
Cite this
}
Analysis of transient signatures of arc faults in power distribution systems via time-frequency analysis. / Crapse, Philip; Wang, Jing Jiang; Shin, Yong June; Dougal, Roger.
Advanced Signal Processing Algorithms, Architectures, and Implementations XVI. 2006. 63130U (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 6313).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
TY - GEN
T1 - Analysis of transient signatures of arc faults in power distribution systems via time-frequency analysis
AU - Crapse, Philip
AU - Wang, Jing Jiang
AU - Shin, Yong June
AU - Dougal, Roger
PY - 2006/11/9
Y1 - 2006/11/9
N2 - This paper draws on an innovative, signal processing-based method that jointly analyzes the time and frequency domains and uses that information to characterize and distinguish the deadly arc faults from the normal operational faults. This paper introduces a variety of new power quality assessment tools developed with the purpose of both detecting an arc fault faster than has yet been done and distinguishing the arc fault from other normal load operations via time-localized spectral characterization. Based on the time and frequency localization of the arc faults, the time varying impedances of the arc fault are modeled in terms of harmonic sources. The accomplishment of these objectives would lead to new, advanced smart arc fault circuit breakers and the modeling & simulation of arc fault phenomena.
AB - This paper draws on an innovative, signal processing-based method that jointly analyzes the time and frequency domains and uses that information to characterize and distinguish the deadly arc faults from the normal operational faults. This paper introduces a variety of new power quality assessment tools developed with the purpose of both detecting an arc fault faster than has yet been done and distinguishing the arc fault from other normal load operations via time-localized spectral characterization. Based on the time and frequency localization of the arc faults, the time varying impedances of the arc fault are modeled in terms of harmonic sources. The accomplishment of these objectives would lead to new, advanced smart arc fault circuit breakers and the modeling & simulation of arc fault phenomena.
UR - http://www.scopus.com/inward/record.url?scp=33750590307&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=33750590307&partnerID=8YFLogxK
U2 - 10.1117/12.681925
DO - 10.1117/12.681925
M3 - Conference contribution
SN - 0819463922
SN - 9780819463920
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Advanced Signal Processing Algorithms, Architectures, and Implementations XVI
ER -