Electrical and thermal characteristics of a high-Tc superconducting (HTS) tape have close relation to a performance of a resistive type superconducting fault current limiter (SFCL). When an HTS coated conductor (CC) is applied to the SFCL, because the CC is a composite conductor, dimensions and material properties including electrical resistivity, thermal conductivity, and volumetric heat capacity of substrate, silver layer, YBCO, and stabilizer of the CC will affect to the fault current limiting performance and recovery time. This paper presents experimental results about fault current test of commercialized CCs to evaluate their compatibilities for resistive SFCLs and a numerical analysis using finite element method to design an HTS conductor for the SFCLs. The results from the analytical models of the CCs were compared to the experimental results. An HTS tape which is more suitable for the resistive type SFCLs was proposed as a conclusion.
Bibliographical noteFunding Information:
Manuscript received October 20, 2009. First published March 01, 2010; current version published May 28, 2010. This research was supported by National Research Lab. Program through the Korea Science and Engineering Foundation funded by the Ministry of Education, Science and Technology (R0A-2007-000-20063-0). Y. J. Kim, D. K. Park, S. E. Yang, W. C. Kim, and T. K. Ko are with the Yonsei University, Korea (e-mail: firstname.lastname@example.org). M. C. Ahn is with Kunsan University, Korea (e-mail: email@example.com). Y. S. Yoon is with Ansan College of Technology, Ansan, Korea (e-mail: firstname.lastname@example.org). N. Y. Kwon and H. Lee are with Department of Materials Science and Engineering, Korea University, Korea (e-mail: email@example.com). Color versions of one or more of the figures in this paper are available online at http://ieeexplore.ieee.org. Digital Object Identifier 10.1109/TASC.2010.2040385
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering