Angular dependence of magnetoresistance and critical current density in YBa2Cu3O7-δ thin films

K. H. Yoo, J. C. Park, H. G. Lee

Research output: Contribution to journalArticle

2 Citations (Scopus)


We have investigated the angular dependence of the resistivity and the critical current density in the magnetic field for YBa2Cu3O7-δ thin films. Angular dependence of the magnetoresistivity is found to follow a sin2 φ form expected for the Lorentz-force-driven flux motion model, although when the magnetic field is applied parallel to the direction of grain or twin boundaries, the resistivity drops are observed depending on the sample. In the angular dependence of the critical current density, asymmetry is observed with respect to φ = 180°, which may be due to surface pinning at the interface between the film and the substrate. However, its angular dependence is explained by the simple flux motion model in spite of asymmetry.

Original languageEnglish
Pages (from-to)695-699
Number of pages5
JournalSolid State Communications
Issue number9
Publication statusPublished - 1992 Sep

All Science Journal Classification (ASJC) codes

  • Chemistry(all)
  • Condensed Matter Physics
  • Materials Chemistry

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