Angular dependence of magnetoresistance and critical current density in YBa2Cu3O7-δ thin films

Kyung-hwa Yoo, J. C. Park, H. G. Lee

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

We have investigated the angular dependence of the resistivity and the critical current density in the magnetic field for YBa2Cu3O7-δ thin films. Angular dependence of the magnetoresistivity is found to follow a sin2 φ form expected for the Lorentz-force-driven flux motion model, although when the magnetic field is applied parallel to the direction of grain or twin boundaries, the resistivity drops are observed depending on the sample. In the angular dependence of the critical current density, asymmetry is observed with respect to φ = 180°, which may be due to surface pinning at the interface between the film and the substrate. However, its angular dependence is explained by the simple flux motion model in spite of asymmetry.

Original languageEnglish
Pages (from-to)695-699
Number of pages5
JournalSolid State Communications
Volume83
Issue number9
DOIs
Publication statusPublished - 1992 Jan 1

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Magnetoresistance
critical current
Magnetic fields
current density
Fluxes
Thin films
Lorentz force
thin films
asymmetry
magnetoresistivity
electrical resistivity
Substrates
magnetic fields
grain boundaries
barium copper yttrium oxide
Direction compound

All Science Journal Classification (ASJC) codes

  • Chemistry(all)
  • Condensed Matter Physics
  • Materials Chemistry

Cite this

@article{24a424b51b6a4fa2bb2b34d36ec53501,
title = "Angular dependence of magnetoresistance and critical current density in YBa2Cu3O7-δ thin films",
abstract = "We have investigated the angular dependence of the resistivity and the critical current density in the magnetic field for YBa2Cu3O7-δ thin films. Angular dependence of the magnetoresistivity is found to follow a sin2 φ form expected for the Lorentz-force-driven flux motion model, although when the magnetic field is applied parallel to the direction of grain or twin boundaries, the resistivity drops are observed depending on the sample. In the angular dependence of the critical current density, asymmetry is observed with respect to φ = 180°, which may be due to surface pinning at the interface between the film and the substrate. However, its angular dependence is explained by the simple flux motion model in spite of asymmetry.",
author = "Kyung-hwa Yoo and Park, {J. C.} and Lee, {H. G.}",
year = "1992",
month = "1",
day = "1",
doi = "10.1016/0038-1098(92)90147-2",
language = "English",
volume = "83",
pages = "695--699",
journal = "Solid State Communications",
issn = "0038-1098",
publisher = "Elsevier Limited",
number = "9",

}

Angular dependence of magnetoresistance and critical current density in YBa2Cu3O7-δ thin films. / Yoo, Kyung-hwa; Park, J. C.; Lee, H. G.

In: Solid State Communications, Vol. 83, No. 9, 01.01.1992, p. 695-699.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Angular dependence of magnetoresistance and critical current density in YBa2Cu3O7-δ thin films

AU - Yoo, Kyung-hwa

AU - Park, J. C.

AU - Lee, H. G.

PY - 1992/1/1

Y1 - 1992/1/1

N2 - We have investigated the angular dependence of the resistivity and the critical current density in the magnetic field for YBa2Cu3O7-δ thin films. Angular dependence of the magnetoresistivity is found to follow a sin2 φ form expected for the Lorentz-force-driven flux motion model, although when the magnetic field is applied parallel to the direction of grain or twin boundaries, the resistivity drops are observed depending on the sample. In the angular dependence of the critical current density, asymmetry is observed with respect to φ = 180°, which may be due to surface pinning at the interface between the film and the substrate. However, its angular dependence is explained by the simple flux motion model in spite of asymmetry.

AB - We have investigated the angular dependence of the resistivity and the critical current density in the magnetic field for YBa2Cu3O7-δ thin films. Angular dependence of the magnetoresistivity is found to follow a sin2 φ form expected for the Lorentz-force-driven flux motion model, although when the magnetic field is applied parallel to the direction of grain or twin boundaries, the resistivity drops are observed depending on the sample. In the angular dependence of the critical current density, asymmetry is observed with respect to φ = 180°, which may be due to surface pinning at the interface between the film and the substrate. However, its angular dependence is explained by the simple flux motion model in spite of asymmetry.

UR - http://www.scopus.com/inward/record.url?scp=0026915576&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0026915576&partnerID=8YFLogxK

U2 - 10.1016/0038-1098(92)90147-2

DO - 10.1016/0038-1098(92)90147-2

M3 - Article

AN - SCOPUS:0026915576

VL - 83

SP - 695

EP - 699

JO - Solid State Communications

JF - Solid State Communications

SN - 0038-1098

IS - 9

ER -