Ant colony based efficient triplet calculation methodology for arithmetic built-in self test

Hong Sik Kim, Hyunjin Kim, Sungho Kang

Research output: Contribution to journalArticle

Abstract

A new methodology of searching for an effective triplet set for an arithmetic built-in self-test is proposed. The proposed methodology minimizes both the number of triplets and the total test length using an ant colony optimization heuristic that iteratively selects the best triplet according to the fault coverage of each solution. Experimental results on the ISCAS 85 and ISCAS 89 benchmark circuits resulted in a 66.6% average triplet size reduction and a 62.7% average test length reduction compared to previous methodologies.

Original languageEnglish
Pages (from-to)877-881
Number of pages5
Journalieice electronics express
Volume5
Issue number20
DOIs
Publication statusPublished - 2008 Oct 25

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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