In this paper, we introduce a new high-resolution reflectometry technique that operates simultaneously in both the time and frequency domains. The approach rests upon time-frequency signal analysis and utilizes a chirp signal multiplied by a Gaussian time envelope. The Gaussian envelope provides time localization, while the chirp allows one to excite the system under test with a swept sinewave covering a frequency band of interest. This latter capability is of particular interest when testing communication cables and systems. Sensitivity in detecting the reflected signal is provided by a time-frequency cross-correlation function. The approach is verified by experimentally locating various types of faults, located at various distances, in RG 142 and RG 400 coaxial cables.
|Number of pages||8|
|Journal||IEEE Transactions on Instrumentation and Measurement|
|Publication status||Published - 2005 Dec|
Bibliographical noteFunding Information:
Manuscript received June 15, 2003; revised January 31, 2005. This work was supported in by the Ministry of Commerce, Industry and Energy, Republic of Korea, Project 00015071, “Smart Wiring Optimal Signal Design and System Development for Electrical and Electronic Wiring Diagnosis,” by the National Radio Research Laboratory, Seoul, Korea, and in part by the U.S. ONR under Grants N00014-02-1-0623 and N00014-00-0368. Y.-J. Shin is with Department of Electrical Engineering, The University of South Carolina, Columbia, SC 29208 USA (e-mail: email@example.com). E. J. Powers is with the Department of Electrical and Computer Engineering, The University of Texas, Austin, TX 78712 USA (e-mail: ejpowers@ mail.utexas.edu). T.-S. Choe is with the Agency for Defence Development, Daejeon, Korea. C.-Y. Hong and E.-S. Song are with Samsung Electronics, Suwon, Korea. J.-G. Yook and J. B. Park are with the Department of Electrical and Electronics Engineering, Yonsei University, Seoul 120-749 Korea, (e-mail: tschoe@ yonsei.ac.kr). Digital Object Identifier 10.1109/TIM.2005.858115
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering