Applications of support vector machines for pattern recognition: A survey

Hyeran Byun, Seong Whan Lee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

201 Citations (Scopus)

Abstract

In this paper, we present a comprehensive survey on applications of Support Vector Machines (SVMs) for pattern recognition. Since SVMs show good generalization performance on many real-life data and the approach is properly motivated theoretically, it has been applied to wide range of applications. This paper describes a brief introduction of SVMs and summarizes its numerous applications.

Original languageEnglish
Title of host publicationPattern Recognition with Support Vector Machines - First International Workshop, SVM 2002 Niagara Falls, Canada, August 10, 2002 Proceedings
EditorsSeong-Whan Lee, Alessandro Verri
PublisherSpringer Verlag
Pages213-236
Number of pages24
ISBN (Print)354044016X
DOIs
Publication statusPublished - 2002
Event1st International Workshop on Pattern Recognition with Support Vector Machines, SVM 2002 - Niagara Falls, Canada
Duration: 2002 Aug 102002 Aug 10

Publication series

NameLecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
Volume2388
ISSN (Print)0302-9743
ISSN (Electronic)1611-3349

Other

Other1st International Workshop on Pattern Recognition with Support Vector Machines, SVM 2002
CountryCanada
CityNiagara Falls
Period02/8/1002/8/10

All Science Journal Classification (ASJC) codes

  • Theoretical Computer Science
  • Computer Science(all)

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  • Cite this

    Byun, H., & Lee, S. W. (2002). Applications of support vector machines for pattern recognition: A survey. In S-W. Lee, & A. Verri (Eds.), Pattern Recognition with Support Vector Machines - First International Workshop, SVM 2002 Niagara Falls, Canada, August 10, 2002 Proceedings (pp. 213-236). (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); Vol. 2388). Springer Verlag. https://doi.org/10.1007/3-540-45665-1_17