Asbestos concentration measurement using differential interference contrast microscopy

Iuliia Zarubiieva, Ji Sok Lee, Gi Byoung Hwang, Gwi Nam Bae, Jae Cheol Shin, Doo Gun Kim, Taik Jin Lee, Hyuk Jae Lee, Deok Ha Woo, Seok Lee, Myoung Ock Cho, Jung Kyung Kim, Seong Chan Jun, Jae Hun Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We designed a new method for imaging and counting the concentration of asbestos fibers. In current research, we combined the principle of Differential Interference Contrast (DIC) microscopy with imaging program for counting their concentration automatically.

Original languageEnglish
Title of host publicationTechnical Digest - 2012 17th Opto-Electronics and Communications Conference, OECC 2012
Pages594-595
Number of pages2
DOIs
Publication statusPublished - 2012 Oct 23
Event2012 17th Opto-Electronics and Communications Conference, OECC 2012 - Busan, Korea, Republic of
Duration: 2012 Jul 22012 Jul 6

Publication series

NameTechnical Digest - 2012 17th Opto-Electronics and Communications Conference, OECC 2012

Other

Other2012 17th Opto-Electronics and Communications Conference, OECC 2012
CountryKorea, Republic of
CityBusan
Period12/7/212/7/6

Fingerprint

Asbestos
Microscopic examination
Imaging techniques
Fibers

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this

Zarubiieva, I., Lee, J. S., Hwang, G. B., Bae, G. N., Shin, J. C., Kim, D. G., ... Kim, J. H. (2012). Asbestos concentration measurement using differential interference contrast microscopy. In Technical Digest - 2012 17th Opto-Electronics and Communications Conference, OECC 2012 (pp. 594-595). [6276588] (Technical Digest - 2012 17th Opto-Electronics and Communications Conference, OECC 2012). https://doi.org/10.1109/OECC.2012.6276588
Zarubiieva, Iuliia ; Lee, Ji Sok ; Hwang, Gi Byoung ; Bae, Gwi Nam ; Shin, Jae Cheol ; Kim, Doo Gun ; Lee, Taik Jin ; Lee, Hyuk Jae ; Woo, Deok Ha ; Lee, Seok ; Cho, Myoung Ock ; Kim, Jung Kyung ; Jun, Seong Chan ; Kim, Jae Hun. / Asbestos concentration measurement using differential interference contrast microscopy. Technical Digest - 2012 17th Opto-Electronics and Communications Conference, OECC 2012. 2012. pp. 594-595 (Technical Digest - 2012 17th Opto-Electronics and Communications Conference, OECC 2012).
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title = "Asbestos concentration measurement using differential interference contrast microscopy",
abstract = "We designed a new method for imaging and counting the concentration of asbestos fibers. In current research, we combined the principle of Differential Interference Contrast (DIC) microscopy with imaging program for counting their concentration automatically.",
author = "Iuliia Zarubiieva and Lee, {Ji Sok} and Hwang, {Gi Byoung} and Bae, {Gwi Nam} and Shin, {Jae Cheol} and Kim, {Doo Gun} and Lee, {Taik Jin} and Lee, {Hyuk Jae} and Woo, {Deok Ha} and Seok Lee and Cho, {Myoung Ock} and Kim, {Jung Kyung} and Jun, {Seong Chan} and Kim, {Jae Hun}",
year = "2012",
month = "10",
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doi = "10.1109/OECC.2012.6276588",
language = "English",
isbn = "9781467309776",
series = "Technical Digest - 2012 17th Opto-Electronics and Communications Conference, OECC 2012",
pages = "594--595",
booktitle = "Technical Digest - 2012 17th Opto-Electronics and Communications Conference, OECC 2012",

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Zarubiieva, I, Lee, JS, Hwang, GB, Bae, GN, Shin, JC, Kim, DG, Lee, TJ, Lee, HJ, Woo, DH, Lee, S, Cho, MO, Kim, JK, Jun, SC & Kim, JH 2012, Asbestos concentration measurement using differential interference contrast microscopy. in Technical Digest - 2012 17th Opto-Electronics and Communications Conference, OECC 2012., 6276588, Technical Digest - 2012 17th Opto-Electronics and Communications Conference, OECC 2012, pp. 594-595, 2012 17th Opto-Electronics and Communications Conference, OECC 2012, Busan, Korea, Republic of, 12/7/2. https://doi.org/10.1109/OECC.2012.6276588

Asbestos concentration measurement using differential interference contrast microscopy. / Zarubiieva, Iuliia; Lee, Ji Sok; Hwang, Gi Byoung; Bae, Gwi Nam; Shin, Jae Cheol; Kim, Doo Gun; Lee, Taik Jin; Lee, Hyuk Jae; Woo, Deok Ha; Lee, Seok; Cho, Myoung Ock; Kim, Jung Kyung; Jun, Seong Chan; Kim, Jae Hun.

Technical Digest - 2012 17th Opto-Electronics and Communications Conference, OECC 2012. 2012. p. 594-595 6276588 (Technical Digest - 2012 17th Opto-Electronics and Communications Conference, OECC 2012).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Zarubiieva I, Lee JS, Hwang GB, Bae GN, Shin JC, Kim DG et al. Asbestos concentration measurement using differential interference contrast microscopy. In Technical Digest - 2012 17th Opto-Electronics and Communications Conference, OECC 2012. 2012. p. 594-595. 6276588. (Technical Digest - 2012 17th Opto-Electronics and Communications Conference, OECC 2012). https://doi.org/10.1109/OECC.2012.6276588