Atomic-scale imaging of few-layer black phosphorus and its reconstructed edge

Yangjin Lee, Jun Yeong Yoon, Declan Scullion, Jeongsu Jang, Elton J.G. Santos, Hu Young Jeong, Kwanpyo Kim

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

Black phosphorus (BP) has recently emerged as an alternative 2D semiconductor owing to its fascinating electronic properties such as tunable bandgap and high charge carrier mobility. The structural investigation of few-layer BP, such as identification of layer thickness and atomic-scale edge structure, is of great importance to fully understand its electronic and optical properties. Here we report atomic-scale analysis of few-layered BP performed by aberration corrected transmission electron microscopy (TEM). We establish the layer-number-dependent atomic resolution imaging of few-layer BP via TEM imaging and image simulations. The structural modification induced by the electron beam leads to revelation of crystalline edge and formation of BP nanoribbons. Atomic resolution imaging of BP clearly shows the reconstructed zigzag (ZZ) edge structures, which is also corroborated by van der Waals first principles calculations on the edge stability. Our study on the precise identification of BP thickness and atomic-resolution imaging of edge structures will lay the groundwork for investigation of few-layer BP, especially BP in nanostructured forms.

Original languageEnglish
Article number084003
JournalJournal of Physics D: Applied Physics
Volume50
Issue number8
DOIs
Publication statusPublished - 2017 Jan 30

Fingerprint

Phosphorus
phosphorus
Imaging techniques
Electronic properties
beam leads
Transmission electron microscopy
Nanoribbons
transmission electron microscopy
Carbon Nanotubes
Carrier mobility
carrier mobility
Aberrations
Charge carriers
electronics
aberration
charge carriers
Electron beams
Energy gap
Optical properties
electron beams

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Acoustics and Ultrasonics
  • Surfaces, Coatings and Films

Cite this

Lee, Yangjin ; Yoon, Jun Yeong ; Scullion, Declan ; Jang, Jeongsu ; Santos, Elton J.G. ; Jeong, Hu Young ; Kim, Kwanpyo. / Atomic-scale imaging of few-layer black phosphorus and its reconstructed edge. In: Journal of Physics D: Applied Physics. 2017 ; Vol. 50, No. 8.
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Atomic-scale imaging of few-layer black phosphorus and its reconstructed edge. / Lee, Yangjin; Yoon, Jun Yeong; Scullion, Declan; Jang, Jeongsu; Santos, Elton J.G.; Jeong, Hu Young; Kim, Kwanpyo.

In: Journal of Physics D: Applied Physics, Vol. 50, No. 8, 084003, 30.01.2017.

Research output: Contribution to journalArticle

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