ATPG-XP: Test generation for maximal crosstalk-induced faults

Sunghoon Chun, Taejin Kim, Sungho Kang

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

In this paper, we propose a new test-generation method for delay faults considering crosstalk-induced delay effects, based on a conventional delay automatic-test-pattern-generation (ATPG) technique in order to reduce the complexity of previous ATPG algorithms and to consider multiple-aggressor crosstalk faults to maximize the noise of the victim line. Since the proposed ATPG for crosstalk-induced delay faults uses physical and timing information, it can reduce the search space of the backward implication of the aggressor's constraints, and it is helpful for reducing the ATPG time cost compared to previous works. In addition, since the proposed technique targets the critical path for the original delay test as the victim lines, it can improve test effectiveness of delay testing. Experimental results demonstrate the effectiveness of the proposed method.

Original languageEnglish
Article number5208481
Pages (from-to)1401-1413
Number of pages13
JournalIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Volume28
Issue number9
DOIs
Publication statusPublished - 2009 Sep 1

Fingerprint

Automatic test pattern generation
Crosstalk
Testing
Costs

All Science Journal Classification (ASJC) codes

  • Software
  • Computer Graphics and Computer-Aided Design
  • Electrical and Electronic Engineering

Cite this

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ATPG-XP : Test generation for maximal crosstalk-induced faults. / Chun, Sunghoon; Kim, Taejin; Kang, Sungho.

In: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Vol. 28, No. 9, 5208481, 01.09.2009, p. 1401-1413.

Research output: Contribution to journalArticle

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