TY - GEN
T1 - Automatic error pattern generation for design error detection in a design validation simulation system
AU - Kang, Sungho
AU - Szygenda, Stephen A.
N1 - Publisher Copyright:
© 1992 IEEE.
Copyright:
Copyright 2019 Elsevier B.V., All rights reserved.
PY - 1992
Y1 - 1992
N2 - Considering the fact that simulation patterns can detect a different number of design errors, the derivation of efficient simulation patterns is important. Automatic error pattern generation is introduced to generate a set of error simulation pattern which can be used as input stimuli for design error simulation, a design validation tool which provides a measure of simulation coverage. These tools provide a solution to a long standing problem that has limited design options and design cycle time. They also can decrease design and testing costs.
AB - Considering the fact that simulation patterns can detect a different number of design errors, the derivation of efficient simulation patterns is important. Automatic error pattern generation is introduced to generate a set of error simulation pattern which can be used as input stimuli for design error simulation, a design validation tool which provides a measure of simulation coverage. These tools provide a solution to a long standing problem that has limited design options and design cycle time. They also can decrease design and testing costs.
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U2 - 10.1109/ASIC.1992.270205
DO - 10.1109/ASIC.1992.270205
M3 - Conference contribution
AN - SCOPUS:85065829657
T3 - Proceedings of International Conference on ASIC
SP - 533
EP - 536
BT - Proceedings - 5th Annual IEEE International ASIC Conference and Exhibit, ASIC 1992
PB - IEEE Computer Society
T2 - 5th Annual IEEE International ASIC Conference and Exhibit, ASIC 1992
Y2 - 21 September 1992 through 25 September 1992
ER -