Considering the fact that simulation patterns can detect a different number of design errors, the derivation of efficient simulation patterns is important. Automatic error pattern generation is introduced to generate a set of error simulation pattern which can be used as input stimuli for design error simulation, a design validation tool which provides a measure of simulation coverage. These tools provide a solution to a long standing problem that has limited design options and design cycle time. They also can decrease design and testing costs.
|Title of host publication||Proceedings - 5th Annual IEEE International ASIC Conference and Exhibit, ASIC 1992|
|Publisher||IEEE Computer Society|
|Number of pages||4|
|Publication status||Published - 1992|
|Event||5th Annual IEEE International ASIC Conference and Exhibit, ASIC 1992 - Rochester, United States|
Duration: 1992 Sep 21 → 1992 Sep 25
|Name||Proceedings of International Conference on ASIC|
|Conference||5th Annual IEEE International ASIC Conference and Exhibit, ASIC 1992|
|Period||92/9/21 → 92/9/25|
Bibliographical notePublisher Copyright:
© 1992 IEEE.
All Science Journal Classification (ASJC) codes
- Hardware and Architecture
- Electrical and Electronic Engineering