Abstract
Considering the fact that simulation patterns can detect a different number of design errors, the derivation of efficient simulation patterns is important. Automatic error pattern generation is introduced to generate a set of error simulation pattern which can be used as input stimuli for design error simulation, a design validation tool which provides a measure of simulation coverage. These tools provide a solution to a long standing problem that has limited design options and design cycle time. They also can decrease design and testing costs.
Original language | English |
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Title of host publication | Proceedings - 5th Annual IEEE International ASIC Conference and Exhibit, ASIC 1992 |
Publisher | IEEE Computer Society |
Pages | 533-536 |
Number of pages | 4 |
ISBN (Electronic) | 0780307682 |
DOIs | |
Publication status | Published - 1992 |
Event | 5th Annual IEEE International ASIC Conference and Exhibit, ASIC 1992 - Rochester, United States Duration: 1992 Sep 21 → 1992 Sep 25 |
Publication series
Name | Proceedings of International Conference on ASIC |
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ISSN (Print) | 2162-7541 |
ISSN (Electronic) | 2162-755X |
Conference
Conference | 5th Annual IEEE International ASIC Conference and Exhibit, ASIC 1992 |
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Country/Territory | United States |
City | Rochester |
Period | 92/9/21 → 92/9/25 |
Bibliographical note
Publisher Copyright:© 1992 IEEE.
All Science Journal Classification (ASJC) codes
- Hardware and Architecture
- Electrical and Electronic Engineering