Abstract
Considering the fact that simulation patterns can detect a different number of design errors, the derivation of efficient simulation patterns is important. Automatic error pattern generation is introduced to generate a set of error simulation pattern which can be used as input stimuli for design error simulation, a design validation tool which provides a measure of simulation coverage. These tools provide a solution to a long standing problem that has limited design options and design cycle time. They also can decrease design and testing costs.
| Original language | English |
|---|---|
| Title of host publication | Proceedings - 5th Annual IEEE International ASIC Conference and Exhibit, ASIC 1992 |
| Publisher | IEEE Computer Society |
| Pages | 533-536 |
| Number of pages | 4 |
| ISBN (Electronic) | 0780307682 |
| DOIs | |
| Publication status | Published - 1992 Jan 1 |
| Event | 5th Annual IEEE International ASIC Conference and Exhibit, ASIC 1992 - Rochester, United States Duration: 1992 Sep 21 → 1992 Sep 25 |
Publication series
| Name | Proceedings of International Conference on ASIC |
|---|---|
| ISSN (Print) | 2162-7541 |
| ISSN (Electronic) | 2162-755X |
Conference
| Conference | 5th Annual IEEE International ASIC Conference and Exhibit, ASIC 1992 |
|---|---|
| Country | United States |
| City | Rochester |
| Period | 92/9/21 → 92/9/25 |
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All Science Journal Classification (ASJC) codes
- Hardware and Architecture
- Electrical and Electronic Engineering
Cite this
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Automatic error pattern generation for design error detection in a design validation simulation system. / Kang, Sungho; Szygenda, Stephen A.
Proceedings - 5th Annual IEEE International ASIC Conference and Exhibit, ASIC 1992. IEEE Computer Society, 1992. p. 533-536 270205 (Proceedings of International Conference on ASIC).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
TY - GEN
T1 - Automatic error pattern generation for design error detection in a design validation simulation system
AU - Kang, Sungho
AU - Szygenda, Stephen A.
PY - 1992/1/1
Y1 - 1992/1/1
N2 - Considering the fact that simulation patterns can detect a different number of design errors, the derivation of efficient simulation patterns is important. Automatic error pattern generation is introduced to generate a set of error simulation pattern which can be used as input stimuli for design error simulation, a design validation tool which provides a measure of simulation coverage. These tools provide a solution to a long standing problem that has limited design options and design cycle time. They also can decrease design and testing costs.
AB - Considering the fact that simulation patterns can detect a different number of design errors, the derivation of efficient simulation patterns is important. Automatic error pattern generation is introduced to generate a set of error simulation pattern which can be used as input stimuli for design error simulation, a design validation tool which provides a measure of simulation coverage. These tools provide a solution to a long standing problem that has limited design options and design cycle time. They also can decrease design and testing costs.
UR - http://www.scopus.com/inward/record.url?scp=85065829657&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85065829657&partnerID=8YFLogxK
U2 - 10.1109/ASIC.1992.270205
DO - 10.1109/ASIC.1992.270205
M3 - Conference contribution
AN - SCOPUS:85065829657
T3 - Proceedings of International Conference on ASIC
SP - 533
EP - 536
BT - Proceedings - 5th Annual IEEE International ASIC Conference and Exhibit, ASIC 1992
PB - IEEE Computer Society
ER -