Big, Deep, and Smart Data in Scanning Probe Microscopy

Sergei V. Kalinin, Evgheni Strelcov, Alex Belianinov, Suhas Somnath, Rama K. Vasudevan, Eric J. Lingerfelt, Richard K. Archibald, Chaomei Chen, Roger Proksch, Nouamane Laanait, Stephen Jesse

Research output: Contribution to journalArticle

41 Citations (Scopus)

Abstract

Scanning probe microscopy (SPM) techniques have opened the door to nanoscience and nanotechnology by enabling imaging and manipulation of the structure and functionality of matter at nanometer and atomic scales. Here, we analyze the scientific discovery process in SPM by following the information flow from the tip-surface junction, to knowledge adoption by the wider scientific community. We further discuss the challenges and opportunities offered by merging SPM with advanced data mining, visual analytics, and knowledge discovery technologies.

Original languageEnglish
Pages (from-to)9068-9086
Number of pages19
JournalACS Nano
Volume10
Issue number10
DOIs
Publication statusPublished - 2016 Oct 25

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Engineering(all)
  • Physics and Astronomy(all)

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  • Cite this

    Kalinin, S. V., Strelcov, E., Belianinov, A., Somnath, S., Vasudevan, R. K., Lingerfelt, E. J., Archibald, R. K., Chen, C., Proksch, R., Laanait, N., & Jesse, S. (2016). Big, Deep, and Smart Data in Scanning Probe Microscopy. ACS Nano, 10(10), 9068-9086. https://doi.org/10.1021/acsnano.6b04212