TY - GEN
T1 - Bit-error rate analysis of integrated optoelectronic receiver
AU - Youn, J. S.
AU - Lee, M. J.
AU - Park, K. Y.
AU - Choi, W. Y.
AU - Rucker, Holger
PY - 2012
Y1 - 2012
N2 - In this paper, we investigate a bit-error rate (BER) of an optoelectronic integrated circuit (OEIC) receiver. For this investigation, signal and noise characteristics of a Si avalanche photodetector and a high-speed electronic circuit are analyzed. Using the fabricated OEIC receiver, 12.5-Gb/s 2 31-1 pseudo-random binary sequence optical signal is successfully detected with BER less than 10-12 at incident optical power of -7 dBm.
AB - In this paper, we investigate a bit-error rate (BER) of an optoelectronic integrated circuit (OEIC) receiver. For this investigation, signal and noise characteristics of a Si avalanche photodetector and a high-speed electronic circuit are analyzed. Using the fabricated OEIC receiver, 12.5-Gb/s 2 31-1 pseudo-random binary sequence optical signal is successfully detected with BER less than 10-12 at incident optical power of -7 dBm.
UR - http://www.scopus.com/inward/record.url?scp=84874430481&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84874430481&partnerID=8YFLogxK
U2 - 10.1109/PGC.2012.6458111
DO - 10.1109/PGC.2012.6458111
M3 - Conference contribution
AN - SCOPUS:84874430481
SN - 9781467325165
T3 - 2012 Photonics Global Conference, PGC 2012
BT - 2012 Photonics Global Conference, PGC 2012
T2 - 2012 Photonics Global Conference, PGC 2012
Y2 - 13 December 2012 through 16 December 2012
ER -