Bit-error rate analysis of integrated optoelectronic receiver

J. S. Youn, M. J. Lee, K. Y. Park, W. Y. Choi, Holger Rucker

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

In this paper, we investigate a bit-error rate (BER) of an optoelectronic integrated circuit (OEIC) receiver. For this investigation, signal and noise characteristics of a Si avalanche photodetector and a high-speed electronic circuit are analyzed. Using the fabricated OEIC receiver, 12.5-Gb/s 2 31-1 pseudo-random binary sequence optical signal is successfully detected with BER less than 10-12 at incident optical power of -7 dBm.

Original languageEnglish
Title of host publication2012 Photonics Global Conference, PGC 2012
DOIs
Publication statusPublished - 2012
Event2012 Photonics Global Conference, PGC 2012 - Singapore, Singapore
Duration: 2012 Dec 132012 Dec 16

Publication series

Name2012 Photonics Global Conference, PGC 2012

Other

Other2012 Photonics Global Conference, PGC 2012
CountrySingapore
CitySingapore
Period12/12/1312/12/16

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Bit-error rate analysis of integrated optoelectronic receiver'. Together they form a unique fingerprint.

  • Cite this

    Youn, J. S., Lee, M. J., Park, K. Y., Choi, W. Y., & Rucker, H. (2012). Bit-error rate analysis of integrated optoelectronic receiver. In 2012 Photonics Global Conference, PGC 2012 [6458111] (2012 Photonics Global Conference, PGC 2012). https://doi.org/10.1109/PGC.2012.6458111