Bit-error rate analysis of integrated optoelectronic receiver

J. S. Youn; M. J. Lee; K. Y. Park; W. Y. Choi; Holger Rucker

doi:10.1109/PGC.2012.6458111

Bit-error rate analysis of integrated optoelectronic receiver

J. S. Youn, M. J. Lee, K. Y. Park, W. Y. Choi, Holger Rucker

Department of Electrical and Electronic Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

Abstract

In this paper, we investigate a bit-error rate (BER) of an optoelectronic integrated circuit (OEIC) receiver. For this investigation, signal and noise characteristics of a Si avalanche photodetector and a high-speed electronic circuit are analyzed. Using the fabricated OEIC receiver, 12.5-Gb/s 2 ³¹-1 pseudo-random binary sequence optical signal is successfully detected with BER less than 10^-12 at incident optical power of -7 dBm.

Original language	English
Title of host publication	2012 Photonics Global Conference, PGC 2012
DOIs	https://doi.org/10.1109/PGC.2012.6458111
Publication status	Published - 2012
Event	2012 Photonics Global Conference, PGC 2012 - Singapore, Singapore Duration: 2012 Dec 13 → 2012 Dec 16

Publication series

Name	2012 Photonics Global Conference, PGC 2012

Other

Other	2012 Photonics Global Conference, PGC 2012
Country	Singapore
City	Singapore
Period	12/12/13 → 12/12/16

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering

Access to Document

10.1109/PGC.2012.6458111

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Cite this

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title = "Bit-error rate analysis of integrated optoelectronic receiver",

abstract = "In this paper, we investigate a bit-error rate (BER) of an optoelectronic integrated circuit (OEIC) receiver. For this investigation, signal and noise characteristics of a Si avalanche photodetector and a high-speed electronic circuit are analyzed. Using the fabricated OEIC receiver, 12.5-Gb/s 2 31-1 pseudo-random binary sequence optical signal is successfully detected with BER less than 10-12 at incident optical power of -7 dBm.",

author = "Youn, {J. S.} and Lee, {M. J.} and Park, {K. Y.} and Choi, {W. Y.} and Holger Rucker",

year = "2012",

doi = "10.1109/PGC.2012.6458111",

language = "English",

isbn = "9781467325165",

series = "2012 Photonics Global Conference, PGC 2012",

booktitle = "2012 Photonics Global Conference, PGC 2012",

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AU - Lee, M. J.

AU - Park, K. Y.

AU - Choi, W. Y.

AU - Rucker, Holger

PY - 2012

Y1 - 2012

N2 - In this paper, we investigate a bit-error rate (BER) of an optoelectronic integrated circuit (OEIC) receiver. For this investigation, signal and noise characteristics of a Si avalanche photodetector and a high-speed electronic circuit are analyzed. Using the fabricated OEIC receiver, 12.5-Gb/s 2 31-1 pseudo-random binary sequence optical signal is successfully detected with BER less than 10-12 at incident optical power of -7 dBm.

AB - In this paper, we investigate a bit-error rate (BER) of an optoelectronic integrated circuit (OEIC) receiver. For this investigation, signal and noise characteristics of a Si avalanche photodetector and a high-speed electronic circuit are analyzed. Using the fabricated OEIC receiver, 12.5-Gb/s 2 31-1 pseudo-random binary sequence optical signal is successfully detected with BER less than 10-12 at incident optical power of -7 dBm.

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DO - 10.1109/PGC.2012.6458111

M3 - Conference contribution

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T3 - 2012 Photonics Global Conference, PGC 2012

BT - 2012 Photonics Global Conference, PGC 2012

T2 - 2012 Photonics Global Conference, PGC 2012

Y2 - 13 December 2012 through 16 December 2012

ER -