Abstract
In this paper, we investigate a bit-error rate (BER) of an optoelectronic integrated circuit (OEIC) receiver. For this investigation, signal and noise characteristics of a Si avalanche photodetector and a high-speed electronic circuit are analyzed. Using the fabricated OEIC receiver, 12.5-Gb/s 2 31-1 pseudo-random binary sequence optical signal is successfully detected with BER less than 10-12 at incident optical power of -7 dBm.
| Original language | English |
|---|---|
| Title of host publication | 2012 Photonics Global Conference, PGC 2012 |
| DOIs | |
| Publication status | Published - 2012 |
| Event | 2012 Photonics Global Conference, PGC 2012 - Singapore, Singapore Duration: 2012 Dec 13 → 2012 Dec 16 |
Publication series
| Name | 2012 Photonics Global Conference, PGC 2012 |
|---|
Other
| Other | 2012 Photonics Global Conference, PGC 2012 |
|---|---|
| Country | Singapore |
| City | Singapore |
| Period | 12/12/13 → 12/12/16 |
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering
Fingerprint Dive into the research topics of 'Bit-error rate analysis of integrated optoelectronic receiver'. Together they form a unique fingerprint.
Cite this
Youn, J. S., Lee, M. J., Park, K. Y., Choi, W. Y., & Rucker, H. (2012). Bit-error rate analysis of integrated optoelectronic receiver. In 2012 Photonics Global Conference, PGC 2012 [6458111] (2012 Photonics Global Conference, PGC 2012). https://doi.org/10.1109/PGC.2012.6458111