Buckling-based measurements of mechanical moduli of thin films

Si Woo Hahm, Hyun Sik Hwang, Donyoung Kim, Dahl Young Khang

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

The buckling-based measurement of mechanical properties of material is reviewed here, which is a very useful technique for the characterization of thin films, nano- or molecular-scale materials, etc. This method is shown to be useful to measure elastic moduli of various thin films such as polymers, polyelectrolyte multilayers (PEM), single-wall carbon nanotubes (SWNT) and millimeter-thick polymer network substrates. Further, it is also shown that the mechanical properties of various organic electronic materials, which may find wide applications in flexible and/or stretchable electronic devices, can be measured by the buckling method. Due to its fast, simple nature, the method can be extended to many other materials, especially to materials existing in thin film form only. The method would be a valuable, complementary technique in mechanical characterization of materials to be added to existing methods such as tensile testing, nano-indentation, and other methods.

Original languageEnglish
Pages (from-to)157-168
Number of pages12
JournalElectronic Materials Letters
Volume5
Issue number4
DOIs
Publication statusPublished - 2009 Dec

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials

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