Built-In Self-Test for static ADC testing with a triangle-wave

Incheol Kim, Ingeol Lee, Sungho Kang

Research output: Contribution to journalArticle

Abstract

This paper proposes a new BIST (Built-In Self-Test) method for static testing of an ADC (Analog-to-Digital Converter) with transition detection method. The proposed BIST uses a triangle-wave as an input test stimulus and calculates the ADC's static parameters. Simulation results show that the proposed BIST can test both rising and falling transitions with minimal hardware overhead.

Original languageEnglish
Pages (from-to)292-294
Number of pages3
JournalIEICE Transactions on Electronics
VolumeE96-C
Issue number2
DOIs
Publication statusPublished - 2013 Feb

Fingerprint

Built-in self test
Digital to analog conversion
Testing
Hardware

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Cite this

Kim, Incheol ; Lee, Ingeol ; Kang, Sungho. / Built-In Self-Test for static ADC testing with a triangle-wave. In: IEICE Transactions on Electronics. 2013 ; Vol. E96-C, No. 2. pp. 292-294.
@article{349eec7277d34848af0a27c9dd19ce9e,
title = "Built-In Self-Test for static ADC testing with a triangle-wave",
abstract = "This paper proposes a new BIST (Built-In Self-Test) method for static testing of an ADC (Analog-to-Digital Converter) with transition detection method. The proposed BIST uses a triangle-wave as an input test stimulus and calculates the ADC's static parameters. Simulation results show that the proposed BIST can test both rising and falling transitions with minimal hardware overhead.",
author = "Incheol Kim and Ingeol Lee and Sungho Kang",
year = "2013",
month = "2",
doi = "10.1587/transele.E96.C.292",
language = "English",
volume = "E96-C",
pages = "292--294",
journal = "IEICE Transactions on Electronics",
issn = "0916-8524",
publisher = "Maruzen Co., Ltd/Maruzen Kabushikikaisha",
number = "2",

}

Built-In Self-Test for static ADC testing with a triangle-wave. / Kim, Incheol; Lee, Ingeol; Kang, Sungho.

In: IEICE Transactions on Electronics, Vol. E96-C, No. 2, 02.2013, p. 292-294.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Built-In Self-Test for static ADC testing with a triangle-wave

AU - Kim, Incheol

AU - Lee, Ingeol

AU - Kang, Sungho

PY - 2013/2

Y1 - 2013/2

N2 - This paper proposes a new BIST (Built-In Self-Test) method for static testing of an ADC (Analog-to-Digital Converter) with transition detection method. The proposed BIST uses a triangle-wave as an input test stimulus and calculates the ADC's static parameters. Simulation results show that the proposed BIST can test both rising and falling transitions with minimal hardware overhead.

AB - This paper proposes a new BIST (Built-In Self-Test) method for static testing of an ADC (Analog-to-Digital Converter) with transition detection method. The proposed BIST uses a triangle-wave as an input test stimulus and calculates the ADC's static parameters. Simulation results show that the proposed BIST can test both rising and falling transitions with minimal hardware overhead.

UR - http://www.scopus.com/inward/record.url?scp=84873681112&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84873681112&partnerID=8YFLogxK

U2 - 10.1587/transele.E96.C.292

DO - 10.1587/transele.E96.C.292

M3 - Article

AN - SCOPUS:84873681112

VL - E96-C

SP - 292

EP - 294

JO - IEICE Transactions on Electronics

JF - IEICE Transactions on Electronics

SN - 0916-8524

IS - 2

ER -