Built-In Self-Test for static ADC testing with a triangle-wave

Incheol Kim, Ingeol Lee, Sungho Kang

Research output: Contribution to journalArticle

Abstract

This paper proposes a new BIST (Built-In Self-Test) method for static testing of an ADC (Analog-to-Digital Converter) with transition detection method. The proposed BIST uses a triangle-wave as an input test stimulus and calculates the ADC's static parameters. Simulation results show that the proposed BIST can test both rising and falling transitions with minimal hardware overhead.

Original languageEnglish
Pages (from-to)292-294
Number of pages3
JournalIEICE Transactions on Electronics
VolumeE96-C
Issue number2
DOIs
Publication statusPublished - 2013 Feb

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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