TY - JOUR
T1 - Built-in self-test implementation for an analog-to-digital converter
AU - Yoo, Kwisung
AU - Kwon, Minho
AU - Bahng, Geumhwan
AU - Hwang, Sangyun
AU - Lee, Hoon
AU - Lee, Jungyoon
AU - Seo, Daesik
AU - Kim, Jaeseok
AU - Kang, Sungho
AU - Han, Gunhee
N1 - Copyright:
Copyright 2004 Elsevier Science B.V., Amsterdam. All rights reserved.
PY - 2002/12
Y1 - 2002/12
N2 - As integrated circuit fabrication techniques advance, a complex system can be integrated on a single chip: namely, a system-on-a-chip (SOC). A SOC consists of many intellectual property (IP) building blocks, including analog-to-digital converters (ADCs) and digital-to-analog converters (DACs) which should provide certain built-in self-test (BIST) scheme to minimize the testing cost. Due to the analog nature of ADCs and DACs, digital BIST schemes are not applicable. This paper proposes a simple ADC BIST scheme based on a ramp test. The proposed BIST scheme is verified by simulation with a 6-bit pipelined ADC. Simulation results show that the proposed ADC BIST scheme can detect not only catastrophic faults but also some parametric faults. The total gate count of the proposed BIST circuit is about 150.
AB - As integrated circuit fabrication techniques advance, a complex system can be integrated on a single chip: namely, a system-on-a-chip (SOC). A SOC consists of many intellectual property (IP) building blocks, including analog-to-digital converters (ADCs) and digital-to-analog converters (DACs) which should provide certain built-in self-test (BIST) scheme to minimize the testing cost. Due to the analog nature of ADCs and DACs, digital BIST schemes are not applicable. This paper proposes a simple ADC BIST scheme based on a ramp test. The proposed BIST scheme is verified by simulation with a 6-bit pipelined ADC. Simulation results show that the proposed ADC BIST scheme can detect not only catastrophic faults but also some parametric faults. The total gate count of the proposed BIST circuit is about 150.
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M3 - Article
AN - SCOPUS:0036947329
VL - 41
SP - 963
EP - 966
JO - Journal of the Korean Physical Society
JF - Journal of the Korean Physical Society
SN - 0374-4884
IS - 6
ER -