We show that from measurements of the reflectivity of a uniaxial medium taken at a finite incidence angle with s- and p-polarized light it is possible to determine the dielectric function both parallel and perpendicular to the optical axis. When applied to layered compounds with its surface parallel to the layers, this technique allows for an accurate determination of the loss function perpendicular to the layers. This is demonstrated for the example of c-axis oriented thin films of the high-Tc superconductor Tl2Ba2Ca2Cu3O10, on which we carried out polarized reflectivity measurements at 45°incidence angle above and below Tc.
All Science Journal Classification (ASJC) codes
- Condensed Matter Physics