Capacity comparison of opportunistic relaying system with outdated channel information

Seokjung Kim, Hyunsoo Kim, Daesik Hong

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper, we investigate the impact of outdated channel state information (CSI) on the capacity of an opportunistic relaying system. We derive the analytical expressions of the channel capacity and its associated outage probability of reactive relay selection for four adaptive transmission techniques. Analytical and numerical results show that the rate adaptation policy achieves better performance compared to the sub-optimal channel inversion in the presence of outdated CSI. In addition, design insights and useful observations for relay selection can be deduced from these results, implying that CSI accuracy in the source-relay link plays a significant role in determining the relay selection strategy for given system parameters.

Original languageEnglish
Title of host publication2015 IEEE International Conference on Communications, ICC 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages2215-2220
Number of pages6
ISBN (Electronic)9781467364324
DOIs
Publication statusPublished - 2015 Sep 9
EventIEEE International Conference on Communications, ICC 2015 - London, United Kingdom
Duration: 2015 Jun 82015 Jun 12

Publication series

NameIEEE International Conference on Communications
Volume2015-September
ISSN (Print)1550-3607

Other

OtherIEEE International Conference on Communications, ICC 2015
CountryUnited Kingdom
CityLondon
Period15/6/815/6/12

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All Science Journal Classification (ASJC) codes

  • Computer Networks and Communications
  • Electrical and Electronic Engineering

Cite this

Kim, S., Kim, H., & Hong, D. (2015). Capacity comparison of opportunistic relaying system with outdated channel information. In 2015 IEEE International Conference on Communications, ICC 2015 (pp. 2215-2220). [7248654] (IEEE International Conference on Communications; Vol. 2015-September). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICC.2015.7248654