Cell-to-cell interference compensation schemes using reduced symbol pattern of interfering cells for MLC NAND flash memory

G. Kong, T. Kim, W. Xi, S. Choi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Cell-to-cell interference compensation schemes using reduced symbol pattern of interfering cells for multi-level cell (MLC) NAND flash memory are proposed in this paper. The proposed schemes contain three signal-processing techniques, estimating cell-to-cell interference, compensating cell-to-cell interference, and generating log-likelihood ratio (LLR). Firstly, reduced symbol pattern of interfering cells is used to easily estimate cell-to-cell interference by setting threshold voltage shift to be only two values in the programming state. Based on this estimation, cell-to-cell interference is compensated by modifying the read voltage in the proposed scheme 1 and by subtracting the estimated cell-to-cell interference from the sensed voltage in the proposed scheme 2. Finally, after conducting compensation, LLR is calculated for low-density parity check codes in the assumption of free cell-to-cell interference since interference between cells is mitigated by the compensation procedure. By using these techniques, the interference can be relaxed with a simpler structure and a higher reliability compared to the conventional methods for MLC NAND flash memory.

Original languageEnglish
Title of host publication2012 Digest APMRC - Asia-Pacific Magnetic Recording Conference
Subtitle of host publicationA Strong Tradition. An Exciting New Look!
Publication statusPublished - 2012
Event2012 Asia-Pacific Magnetic Recording Conference: A Strong Tradition. An Exciting New Look!, APMRC 2012 - Singapore, Singapore
Duration: 2012 Oct 312012 Nov 2

Publication series

Name2012 Digest APMRC - Asia-Pacific Magnetic Recording Conference: A Strong Tradition. An Exciting New Look!

Other

Other2012 Asia-Pacific Magnetic Recording Conference: A Strong Tradition. An Exciting New Look!, APMRC 2012
Country/TerritorySingapore
CitySingapore
Period12/10/3112/11/2

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials

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