Channel doping-dependent analytical model for symmetric double gate metal-oxide-semiconductor field-effect transistor. II. Continuous drain current model from subthreshold to inversion region

Edward Namkyu Cho, Yong Hyeon Shin, Ilgu Yun

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2 Citations (Scopus)

Abstract

Based on the subthreshold region model described in Paper I [Cho, J. Appl. Phys. 113, 214506 (2013)], a continuous drain current model with a variation of channel doping concentration (NA) for symmetric double gate metal-oxide-semiconductor field-effect transistor is presented. Here, the inversion region drain current model is derived by solving the long-channel 1D Poisson's equation due to the strong screening effects by electrons. The continuous drain current model is obtained by interpolating the subthreshold region model and the inversion region model. Since the subthreshold region model includes the short-channel effects, it is shown that the continuous drain current modeling results are in good agreement with commercially available 2D numerical simulation results from the subthreshold to the inversion region in the wide range of NA.

Original languageEnglish
Article number214507
JournalJournal of Applied Physics
Volume113
Issue number21
DOIs
Publication statusPublished - 2013 Jun 7

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metal oxide semiconductors
field effect transistors
inversions
Poisson equation
screening
electrons
simulation

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Cite this

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abstract = "Based on the subthreshold region model described in Paper I [Cho, J. Appl. Phys. 113, 214506 (2013)], a continuous drain current model with a variation of channel doping concentration (NA) for symmetric double gate metal-oxide-semiconductor field-effect transistor is presented. Here, the inversion region drain current model is derived by solving the long-channel 1D Poisson's equation due to the strong screening effects by electrons. The continuous drain current model is obtained by interpolating the subthreshold region model and the inversion region model. Since the subthreshold region model includes the short-channel effects, it is shown that the continuous drain current modeling results are in good agreement with commercially available 2D numerical simulation results from the subthreshold to the inversion region in the wide range of NA.",
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T1 - Channel doping-dependent analytical model for symmetric double gate metal-oxide-semiconductor field-effect transistor. II. Continuous drain current model from subthreshold to inversion region

AU - Cho, Edward Namkyu

AU - Shin, Yong Hyeon

AU - Yun, Ilgu

PY - 2013/6/7

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N2 - Based on the subthreshold region model described in Paper I [Cho, J. Appl. Phys. 113, 214506 (2013)], a continuous drain current model with a variation of channel doping concentration (NA) for symmetric double gate metal-oxide-semiconductor field-effect transistor is presented. Here, the inversion region drain current model is derived by solving the long-channel 1D Poisson's equation due to the strong screening effects by electrons. The continuous drain current model is obtained by interpolating the subthreshold region model and the inversion region model. Since the subthreshold region model includes the short-channel effects, it is shown that the continuous drain current modeling results are in good agreement with commercially available 2D numerical simulation results from the subthreshold to the inversion region in the wide range of NA.

AB - Based on the subthreshold region model described in Paper I [Cho, J. Appl. Phys. 113, 214506 (2013)], a continuous drain current model with a variation of channel doping concentration (NA) for symmetric double gate metal-oxide-semiconductor field-effect transistor is presented. Here, the inversion region drain current model is derived by solving the long-channel 1D Poisson's equation due to the strong screening effects by electrons. The continuous drain current model is obtained by interpolating the subthreshold region model and the inversion region model. Since the subthreshold region model includes the short-channel effects, it is shown that the continuous drain current modeling results are in good agreement with commercially available 2D numerical simulation results from the subthreshold to the inversion region in the wide range of NA.

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