Characterization and luminescence properties of Alq3 films grown by ionized-cluster-beam deposition, neutral-cluster-beam deposition and thermal evaporation

S. Y. Kim, S. Y. Ryu, J. M. Choi, S. J. Kang, S. P. Park, Seongil Im, C. N. Whang, D. S. Choi

Research output: Contribution to journalArticle

24 Citations (Scopus)

Abstract

Tris-(8-hydroxyquinoline) aluminum (Alq3) films have been grown on silicon substrates by several techniques: neutral-cluster-beam deposition; thermal evaporation; and ionized-cluster-beam deposition technique. The films were characterized by low angle X-ray reflectivity, atomic force microscopy, Fourier transformed infrared (FTIR) spectroscopy and photoluminescence. According to the FTIR spectroscopy measurement, the spectra of all the Alq3 samples show almost the same signals of atomic binding regardless of the process conditions. However, the photoluminescence intensities of the films are different. When all the films are adjusted to the same thickness, neutral-cluster-beam deposition films show more intense photoluminescence than the thermal-evaporated ones, while ionized-cluster-beam deposition samples are found to be inferior in intensity. Since the photoluminescence intensity of the 8-hydroxyquinoline aluminum layers is one of the important factors for the performance of organic light emitting devices, the neutral-cluster-beam deposition seems to be a promising method for the film deposition of organic electroluminescence materials.

Original languageEnglish
Pages (from-to)78-81
Number of pages4
JournalThin Solid Films
Volume398-399
DOIs
Publication statusPublished - 2001 Jan 1

Fingerprint

Thermal evaporation
Luminescence
evaporation
luminescence
Photoluminescence
photoluminescence
Infrared spectroscopy
infrared spectroscopy
aluminum
Oxyquinoline
Aluminum
Electroluminescence
Silicon
electroluminescence
Atomic force microscopy
atomic force microscopy
reflectance
X rays
silicon
Substrates

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

Cite this

Kim, S. Y. ; Ryu, S. Y. ; Choi, J. M. ; Kang, S. J. ; Park, S. P. ; Im, Seongil ; Whang, C. N. ; Choi, D. S. / Characterization and luminescence properties of Alq3 films grown by ionized-cluster-beam deposition, neutral-cluster-beam deposition and thermal evaporation. In: Thin Solid Films. 2001 ; Vol. 398-399. pp. 78-81.
@article{b2fe992365f148ef946303cc0047307e,
title = "Characterization and luminescence properties of Alq3 films grown by ionized-cluster-beam deposition, neutral-cluster-beam deposition and thermal evaporation",
abstract = "Tris-(8-hydroxyquinoline) aluminum (Alq3) films have been grown on silicon substrates by several techniques: neutral-cluster-beam deposition; thermal evaporation; and ionized-cluster-beam deposition technique. The films were characterized by low angle X-ray reflectivity, atomic force microscopy, Fourier transformed infrared (FTIR) spectroscopy and photoluminescence. According to the FTIR spectroscopy measurement, the spectra of all the Alq3 samples show almost the same signals of atomic binding regardless of the process conditions. However, the photoluminescence intensities of the films are different. When all the films are adjusted to the same thickness, neutral-cluster-beam deposition films show more intense photoluminescence than the thermal-evaporated ones, while ionized-cluster-beam deposition samples are found to be inferior in intensity. Since the photoluminescence intensity of the 8-hydroxyquinoline aluminum layers is one of the important factors for the performance of organic light emitting devices, the neutral-cluster-beam deposition seems to be a promising method for the film deposition of organic electroluminescence materials.",
author = "Kim, {S. Y.} and Ryu, {S. Y.} and Choi, {J. M.} and Kang, {S. J.} and Park, {S. P.} and Seongil Im and Whang, {C. N.} and Choi, {D. S.}",
year = "2001",
month = "1",
day = "1",
doi = "10.1016/S0040-6090(01)01306-2",
language = "English",
volume = "398-399",
pages = "78--81",
journal = "Thin Solid Films",
issn = "0040-6090",
publisher = "Elsevier",

}

Characterization and luminescence properties of Alq3 films grown by ionized-cluster-beam deposition, neutral-cluster-beam deposition and thermal evaporation. / Kim, S. Y.; Ryu, S. Y.; Choi, J. M.; Kang, S. J.; Park, S. P.; Im, Seongil; Whang, C. N.; Choi, D. S.

In: Thin Solid Films, Vol. 398-399, 01.01.2001, p. 78-81.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Characterization and luminescence properties of Alq3 films grown by ionized-cluster-beam deposition, neutral-cluster-beam deposition and thermal evaporation

AU - Kim, S. Y.

AU - Ryu, S. Y.

AU - Choi, J. M.

AU - Kang, S. J.

AU - Park, S. P.

AU - Im, Seongil

AU - Whang, C. N.

AU - Choi, D. S.

PY - 2001/1/1

Y1 - 2001/1/1

N2 - Tris-(8-hydroxyquinoline) aluminum (Alq3) films have been grown on silicon substrates by several techniques: neutral-cluster-beam deposition; thermal evaporation; and ionized-cluster-beam deposition technique. The films were characterized by low angle X-ray reflectivity, atomic force microscopy, Fourier transformed infrared (FTIR) spectroscopy and photoluminescence. According to the FTIR spectroscopy measurement, the spectra of all the Alq3 samples show almost the same signals of atomic binding regardless of the process conditions. However, the photoluminescence intensities of the films are different. When all the films are adjusted to the same thickness, neutral-cluster-beam deposition films show more intense photoluminescence than the thermal-evaporated ones, while ionized-cluster-beam deposition samples are found to be inferior in intensity. Since the photoluminescence intensity of the 8-hydroxyquinoline aluminum layers is one of the important factors for the performance of organic light emitting devices, the neutral-cluster-beam deposition seems to be a promising method for the film deposition of organic electroluminescence materials.

AB - Tris-(8-hydroxyquinoline) aluminum (Alq3) films have been grown on silicon substrates by several techniques: neutral-cluster-beam deposition; thermal evaporation; and ionized-cluster-beam deposition technique. The films were characterized by low angle X-ray reflectivity, atomic force microscopy, Fourier transformed infrared (FTIR) spectroscopy and photoluminescence. According to the FTIR spectroscopy measurement, the spectra of all the Alq3 samples show almost the same signals of atomic binding regardless of the process conditions. However, the photoluminescence intensities of the films are different. When all the films are adjusted to the same thickness, neutral-cluster-beam deposition films show more intense photoluminescence than the thermal-evaporated ones, while ionized-cluster-beam deposition samples are found to be inferior in intensity. Since the photoluminescence intensity of the 8-hydroxyquinoline aluminum layers is one of the important factors for the performance of organic light emitting devices, the neutral-cluster-beam deposition seems to be a promising method for the film deposition of organic electroluminescence materials.

UR - http://www.scopus.com/inward/record.url?scp=0035506840&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0035506840&partnerID=8YFLogxK

U2 - 10.1016/S0040-6090(01)01306-2

DO - 10.1016/S0040-6090(01)01306-2

M3 - Article

AN - SCOPUS:0035506840

VL - 398-399

SP - 78

EP - 81

JO - Thin Solid Films

JF - Thin Solid Films

SN - 0040-6090

ER -