Characterization of a stress-applied polarization-maintaining (PM) fiber through photoelastic tomography

Yongwoo Park, Uh Chul Paek, Dug Young Kim

Research output: Contribution to journalArticle

18 Citations (Scopus)

Abstract

An accurate two-dimensional (2-D) axial stress profile of a polarization-maintaining (PM) fiber was determined using high-resolution photoelastic tomography. Likewise, determining all of the stress components of the fiber and the complete expression of stress-induced anisotropy was demonstrated. For the first time, we have expressed the anisotropy of a PM fiber in terms of birefringence distribution, and we have displayed the trajectories of principal axes on the cross section of the fiber. Mode coupling between the two orthogonal polarization modes due to the asymmetric stress applying parts of the PM fiber was also analyzed using an approximated coupled mode equation.

Original languageEnglish
Pages (from-to)997-1004
Number of pages8
JournalJournal of Lightwave Technology
Volume21
Issue number4
DOIs
Publication statusPublished - 2003 Apr 1

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tomography
fibers
polarization
coupled modes
axial stress
anisotropy
birefringence
trajectories
high resolution
cross sections
profiles

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics

Cite this

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Characterization of a stress-applied polarization-maintaining (PM) fiber through photoelastic tomography. / Park, Yongwoo; Paek, Uh Chul; Kim, Dug Young.

In: Journal of Lightwave Technology, Vol. 21, No. 4, 01.04.2003, p. 997-1004.

Research output: Contribution to journalArticle

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