Engineering & Materials Science
Silica
100%
Thin films
91%
Hot Temperature
46%
Spectroscopic ellipsometry
35%
Thermal conductivity
35%
Porosity
33%
Infrared absorption
31%
Spin coating
28%
Refractive index
25%
Fourier transform infrared spectroscopy
24%
Surface active agents
21%
Film thickness
20%
X ray diffraction
19%
Scanning electron microscopy
15%
Physics & Astronomy
isolation
92%
silicon dioxide
74%
characterization
54%
thin films
50%
porosity
42%
thermal conductivity
30%
infrared absorption
19%
ellipsometry
19%
surfactants
18%
coating
17%
infrared spectroscopy
17%
film thickness
15%
refractivity
13%
scanning electron microscopy
12%
diffraction
10%
x rays
8%
Chemistry
Liquid Film
47%
Thermal Conductivity
30%
Application
30%
Porosity
18%
Ellipsometry
17%
Spin Coating
16%
Refractive Index
15%
Meso Porosity
12%
Pore
10%
Scanning Electron Microscopy
9%
Fourier Transform Infrared Spectroscopy
9%
X-Ray Diffraction
8%