Characterization of wafer-scale MoS2 and WSe2 2D films by spectroscopic ellipsometry

Mangesh S. Diware, Kyunam Park, Jihun Mun, Han Gyeol Park, Won Chegal, Yong Jai Cho, Hyun Mo Cho, Jusang Park, Hyungjun Kim, Sang Woo Kang, Young Dong Kim

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19 Citations (Scopus)

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