Characterizing the intelligence analysis process

Informing visual analytics design through a longitudinal field study

Youn Ah Kang, John Stasko

Research output: Chapter in Book/Report/Conference proceedingConference contribution

46 Citations (Scopus)

Abstract

While intelligence analysis has been a primary target domain for visual analytics system development, relatively little user and task analysis has been conducted within this area. Our research community's understanding of the work processes and practices of intelligence analysts is not deep enough to adequately address their needs. Without a better understanding of the analysts and their problems, we cannot build visual analytics systems that integrate well with their work processes and truly provide benefit to them. In order to close this knowledge gap, we conducted a longitudinal, observational field study of intelligence analysts in training within the intelligence program at Mercyhurst College. We observed three teams of analysts, each working on an intelligence problem for a ten-week period. Based upon study findings, we describe and characterize processes and methods of intelligence analysis that we observed, make clarifications regarding the processes and practices, and suggest design implications for visual analytics systems for intelligence analysis.

Original languageEnglish
Title of host publicationVAST 2011 - IEEE Conference on Visual Analytics Science and Technology 2011, Proceedings
Pages21-30
Number of pages10
DOIs
Publication statusPublished - 2011 Dec 1
Event2nd IEEE Conference on Visual Analytics Science and Technology 2011, VAST 2011 - Providence, RI, United States
Duration: 2011 Oct 232011 Oct 28

Publication series

NameVAST 2011 - IEEE Conference on Visual Analytics Science and Technology 2011, Proceedings

Other

Other2nd IEEE Conference on Visual Analytics Science and Technology 2011, VAST 2011
CountryUnited States
CityProvidence, RI
Period11/10/2311/10/28

All Science Journal Classification (ASJC) codes

  • Computer Vision and Pattern Recognition

Cite this

Kang, Y. A., & Stasko, J. (2011). Characterizing the intelligence analysis process: Informing visual analytics design through a longitudinal field study. In VAST 2011 - IEEE Conference on Visual Analytics Science and Technology 2011, Proceedings (pp. 21-30). [6102438] (VAST 2011 - IEEE Conference on Visual Analytics Science and Technology 2011, Proceedings). https://doi.org/10.1109/VAST.2011.6102438
Kang, Youn Ah ; Stasko, John. / Characterizing the intelligence analysis process : Informing visual analytics design through a longitudinal field study. VAST 2011 - IEEE Conference on Visual Analytics Science and Technology 2011, Proceedings. 2011. pp. 21-30 (VAST 2011 - IEEE Conference on Visual Analytics Science and Technology 2011, Proceedings).
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Kang, YA & Stasko, J 2011, Characterizing the intelligence analysis process: Informing visual analytics design through a longitudinal field study. in VAST 2011 - IEEE Conference on Visual Analytics Science and Technology 2011, Proceedings., 6102438, VAST 2011 - IEEE Conference on Visual Analytics Science and Technology 2011, Proceedings, pp. 21-30, 2nd IEEE Conference on Visual Analytics Science and Technology 2011, VAST 2011, Providence, RI, United States, 11/10/23. https://doi.org/10.1109/VAST.2011.6102438

Characterizing the intelligence analysis process : Informing visual analytics design through a longitudinal field study. / Kang, Youn Ah; Stasko, John.

VAST 2011 - IEEE Conference on Visual Analytics Science and Technology 2011, Proceedings. 2011. p. 21-30 6102438 (VAST 2011 - IEEE Conference on Visual Analytics Science and Technology 2011, Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Kang YA, Stasko J. Characterizing the intelligence analysis process: Informing visual analytics design through a longitudinal field study. In VAST 2011 - IEEE Conference on Visual Analytics Science and Technology 2011, Proceedings. 2011. p. 21-30. 6102438. (VAST 2011 - IEEE Conference on Visual Analytics Science and Technology 2011, Proceedings). https://doi.org/10.1109/VAST.2011.6102438