Chalcogen-doped manganese oxides have prepared by Chimie Douce redox reaction between permanganate and chalcogen element fine powder under: acidic condition (pH = 1). According to powder X-ray diffraction analyses, the S- and Se-doped manganese oxides are crystallized with layered bimessite and tunnel-type α-MnO2 structures, respectively. On the contrary, Te-doped compound was found to be X-ray amorphous. According to EDS analyses, these compounds contain chalcogen dopants with the, ratio of chalcogen/manganese = 4-7%. We have investigated the chemical bonding character of these materials with X-ray absorption spectroscopic (XAS) analysis. Mn K-edge XAS results clearly demonstrated that the manganese ions: are stabilized in octahedral symmetry with the mixed oxidation states of +3/+4. On the other hand, according to Se K- and Te L1-edge XAS results, selenium and tellurium elements have the high oxidation states of +6, which is surely due to the oxidation of neutral chalcogen element by the strong oxidant permanganate ion. Taking into account their crystal structures and Mn oxidation states, the obtained manganese oxides are expected to be applicable as electrode materials for lithium secondary batteries.
|Number of pages||6|
|Journal||Journal of the Korean Chemical Society|
|Publication status||Published - 2006 Aug 20|
All Science Journal Classification (ASJC) codes
- Chemistry (miscellaneous)
- Chemical Engineering (miscellaneous)