CMOS image sensor with analog gamma correction using nonlinear single-slope ADC

Seogheon Ham, Yonghee Lee, Wunki Jung, Seunghyun Lim, Kwisung Yoo, Youngcheol Chae, Jihyun Cho, Dongmyung Lee, Gunhee Han

Research output: Chapter in Book/Report/Conference proceedingConference contribution

23 Citations (Scopus)

Abstract

A human eye has the logarithmic response over wide range of light intensity. Although the gain can be set high to identify details in darker area on the image, this results in saturation in brighter area. The gamma correction is essential to fit the human eye. However, the digital gamma correction degrades image quality especially for darker area on the image due to the limited ADC resolution and the dynamic range. This paper proposes a CMOS image sensor (CIS) with nonlinear analog-to-digital converter (ADC) which performs analog gamma correction. The CIS with the proposed nonlinear ADC conversion scheme was fabricated with a 0.35-μm CMOS process. The test results show the improved image quality than digital gamma correction.

Original languageEnglish
Title of host publicationISCAS 2006
Subtitle of host publication2006 IEEE International Symposium on Circuits and Systems, Proceedings
Pages3578-3581
Number of pages4
Publication statusPublished - 2006 Dec 1
EventISCAS 2006: 2006 IEEE International Symposium on Circuits and Systems - Kos, Greece
Duration: 2006 May 212006 May 24

Other

OtherISCAS 2006: 2006 IEEE International Symposium on Circuits and Systems
CountryGreece
CityKos
Period06/5/2106/5/24

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'CMOS image sensor with analog gamma correction using nonlinear single-slope ADC'. Together they form a unique fingerprint.

  • Cite this

    Ham, S., Lee, Y., Jung, W., Lim, S., Yoo, K., Chae, Y., Cho, J., Lee, D., & Han, G. (2006). CMOS image sensor with analog gamma correction using nonlinear single-slope ADC. In ISCAS 2006: 2006 IEEE International Symposium on Circuits and Systems, Proceedings (pp. 3578-3581). [1693400]