Abstract
In previous quality assessment studies on stereoscopic 3D (S3D) images, researchers have concentrated on deriving manually extracted features which represent the quality of images. These features are based on the human visual system or natural scene statistics, but they have not been revealed as a deterministic function, preventing to guarantee the robustness of features. To solve this problem, we introduce a deep learning method for predicting the quality of S3D images without a reference. A convolutional neural network (CNN) model is trained through two-step learning. First, to overcome the lack of training data, patch-based CNNs are introduced. And then, automatically extracted patch features are pooled into image features. Finally, the trained CNN model parameters are updated iteratively using holistic image labeling, i.e., mean opinion score (MOS). The proposed method represents a significant improvement compared to other no-reference (NR) S3D image quality assessment (IQA) algorithms.
Original language | English |
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Title of host publication | 2019 IEEE International Conference on Image Processing, ICIP 2019 - Proceedings |
Publisher | IEEE Computer Society |
Pages | 1745-1749 |
Number of pages | 5 |
ISBN (Electronic) | 9781538662496 |
DOIs | |
Publication status | Published - 2019 Sept |
Event | 26th IEEE International Conference on Image Processing, ICIP 2019 - Taipei, Taiwan, Province of China Duration: 2019 Sept 22 → 2019 Sept 25 |
Publication series
Name | Proceedings - International Conference on Image Processing, ICIP |
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Volume | 2019-September |
ISSN (Print) | 1522-4880 |
Conference
Conference | 26th IEEE International Conference on Image Processing, ICIP 2019 |
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Country/Territory | Taiwan, Province of China |
City | Taipei |
Period | 19/9/22 → 19/9/25 |
Bibliographical note
Funding Information:This work was supported by Samsung Research Funding Center of Sam-sung Electronics under Project Number SRFC-IT1702-08
Publisher Copyright:
© 2019 IEEE.
All Science Journal Classification (ASJC) codes
- Software
- Computer Vision and Pattern Recognition
- Signal Processing