Code-Width Testing-Based Compact ADC BIST Circuit

Dongmyung Lee, Kwisung Yoo, Kicheol Kim, Gunhee Han, Sungho Kang

Research output: Contribution to journalArticlepeer-review

29 Citations (Scopus)

Abstract

This paper proposes a new analog-to-digital converter,(ADC) built-in self-test,(BIST) scheme based on code-width and sample-difference testing that does not require a slope-calibrated ramp signal. The proposed BIST scheme can be implemented by a simple digital circuit whose gate count is only approximately 550. The proposed BIST scheme is verified by simulation with 138 test circuits of 6-b pipeline ADC with arbitrary faults. Simulation results show that it effectively detects not only the catastrophic faults but also some parametric faults. The simulated fault coverage is approximately 99%.

Original languageEnglish
Pages (from-to)603-606
Number of pages4
JournalIEEE Transactions on Circuits and Systems II: Express Briefs
Volume51
Issue number11
DOIs
Publication statusPublished - 2004 Nov

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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