Color transient improvement via range detection

Gun Shik Shin, Moon Gi Kang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

In broadcast system, the image information is transmitted in the form of luminance and color difference signals. The color difference signals usually undergo blurs by the several reasons and result in smooth transition. It is important for the CTI algorithm not to produce color mismatch in the smooth transition as well as to make the transition sharp. In this paper, the new CTI algorithm which only needs to determine the transition range is proposed. Since the corrected signal does not rely on the high-frequency values, it does not reveal over- and undershoot near edges. To prevent the color mismatch, transition range is found on only one color difference channel. Experimental results show that our algorithm corrects blurred color edges well and is robust to the input images.

Original languageEnglish
Title of host publicationImage Processing
Subtitle of host publicationAlgorithms and Systems, Neural Networks, and Machine Learning - Proceedings of SPIE-IS and T Electronic Imaging
DOIs
Publication statusPublished - 2006 Apr 17
EventImage Processing: Algorithms and Systems, Neural Networks, and Machine Learning - San Jose, CA, United States
Duration: 2006 Jan 162006 Jan 18

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6064
ISSN (Print)0277-786X

Other

OtherImage Processing: Algorithms and Systems, Neural Networks, and Machine Learning
CountryUnited States
CitySan Jose, CA
Period06/1/1606/1/18

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Shin, G. S., & Kang, M. G. (2006). Color transient improvement via range detection. In Image Processing: Algorithms and Systems, Neural Networks, and Machine Learning - Proceedings of SPIE-IS and T Electronic Imaging [60640A] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 6064). https://doi.org/10.1117/12.642139