This paper presents a low noise CMOS image sensor (CIS) using 10/12 bit configurable column-parallel single slope ADCs (SS-ADCs) and digital correlated multiple sampling (CMS). The sensor used is a conventional 4T active pixel with a pinned-photodiode as photon detector. The test sensor was fabricated in a 0.18 μm CMOS image sensor process from TSMC. The ADC nonlinearity measurement result shows totally 0.58% nonlinearity. Using the proposed column-parallel SS-ADC with digital CMS technique, 65% random noise reduction is obtained. The significant noise reduction enhances the sensor's SNR with 9 dB.
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