Comparison of PCA-based neural network models using the screening of X-ray diffraction data for MOMBE-grown HfO₂ thin film characteristics

Computer Science

• Compressed Data 50%
• Neural Network Model 50%
• Neural Networks 100%
• Principal Component 50%
• Process Model 50%
• Ray Diffraction 100%

Mathematics

• Hysteresis 50%
• Input Process 50%
• PCA 50%
• Principal Component 50%
• Principal Component Analysis 100%
• Process Parameter 50%
• Response Model 50%

Material Science

• Capacitance 50%
• Dielectric Material 50%
• Materials Property 50%
• Thin Films 100%