Abstract
For condition monitoring, time-frequency domain reflectometry is adapted in the instrumentation and control cable of nuclear power plants regarding thermal stress. Cable samples are accelerated thermally aged to a higher than the normal operating temperature. While thermal stress is afflicted to the cable samples, TFDR has been implemented to measure the reflected signal and assess the condition of the cable in real-Time. A transition in cable status can be observed during each test which apparently is an indication that thermal stress affects cable condition. Furthermore, the phase variation of the reflected signal is estimated to analyze the impedance variation. Experimental results show that TFDR can be used to monitor the condition of cable for thermal aging process.
| Original language | English |
|---|---|
| Title of host publication | CEIDP 2017 - IEEE Conference on Electrical Insulation and Dielectric Phenomenon |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 290-294 |
| Number of pages | 5 |
| Volume | 2017-October |
| ISBN (Electronic) | 9781538611944 |
| DOIs | |
| Publication status | Published - 2018 Jan 12 |
| Event | 2017 IEEE Conference on Electrical Insulation and Dielectric Phenomenon, CEIDP 2017 - Texas, United States Duration: 2017 Oct 22 → 2017 Oct 25 |
Other
| Other | 2017 IEEE Conference on Electrical Insulation and Dielectric Phenomenon, CEIDP 2017 |
|---|---|
| Country | United States |
| City | Texas |
| Period | 17/10/22 → 17/10/25 |
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All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering
Cite this
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Condition monitoring of cable aging via time-frequency domain reflectometry in real-Time. / Lee, C. K.; Chang, S. J.; Jung, M. K.; Shin, Yong June.
CEIDP 2017 - IEEE Conference on Electrical Insulation and Dielectric Phenomenon. Vol. 2017-October Institute of Electrical and Electronics Engineers Inc., 2018. p. 290-294.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
TY - GEN
T1 - Condition monitoring of cable aging via time-frequency domain reflectometry in real-Time
AU - Lee, C. K.
AU - Chang, S. J.
AU - Jung, M. K.
AU - Shin, Yong June
PY - 2018/1/12
Y1 - 2018/1/12
N2 - For condition monitoring, time-frequency domain reflectometry is adapted in the instrumentation and control cable of nuclear power plants regarding thermal stress. Cable samples are accelerated thermally aged to a higher than the normal operating temperature. While thermal stress is afflicted to the cable samples, TFDR has been implemented to measure the reflected signal and assess the condition of the cable in real-Time. A transition in cable status can be observed during each test which apparently is an indication that thermal stress affects cable condition. Furthermore, the phase variation of the reflected signal is estimated to analyze the impedance variation. Experimental results show that TFDR can be used to monitor the condition of cable for thermal aging process.
AB - For condition monitoring, time-frequency domain reflectometry is adapted in the instrumentation and control cable of nuclear power plants regarding thermal stress. Cable samples are accelerated thermally aged to a higher than the normal operating temperature. While thermal stress is afflicted to the cable samples, TFDR has been implemented to measure the reflected signal and assess the condition of the cable in real-Time. A transition in cable status can be observed during each test which apparently is an indication that thermal stress affects cable condition. Furthermore, the phase variation of the reflected signal is estimated to analyze the impedance variation. Experimental results show that TFDR can be used to monitor the condition of cable for thermal aging process.
UR - http://www.scopus.com/inward/record.url?scp=85045222990&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85045222990&partnerID=8YFLogxK
U2 - 10.1109/CEIDP.2017.8257585
DO - 10.1109/CEIDP.2017.8257585
M3 - Conference contribution
AN - SCOPUS:85045222990
VL - 2017-October
SP - 290
EP - 294
BT - CEIDP 2017 - IEEE Conference on Electrical Insulation and Dielectric Phenomenon
PB - Institute of Electrical and Electronics Engineers Inc.
ER -