Condition monitoring of cable aging via time-frequency domain reflectometry in real-Time

C. K. Lee, S. J. Chang, M. K. Jung, Y. J. Shin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

For condition monitoring, time-frequency domain reflectometry is adapted in the instrumentation and control cable of nuclear power plants regarding thermal stress. Cable samples are accelerated thermally aged to a higher than the normal operating temperature. While thermal stress is afflicted to the cable samples, TFDR has been implemented to measure the reflected signal and assess the condition of the cable in real-Time. A transition in cable status can be observed during each test which apparently is an indication that thermal stress affects cable condition. Furthermore, the phase variation of the reflected signal is estimated to analyze the impedance variation. Experimental results show that TFDR can be used to monitor the condition of cable for thermal aging process.

Original languageEnglish
Title of host publicationCEIDP 2017 - IEEE Conference on Electrical Insulation and Dielectric Phenomenon
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages290-294
Number of pages5
ISBN (Electronic)9781538611944
DOIs
Publication statusPublished - 2018 Jan 12
Event2017 IEEE Conference on Electrical Insulation and Dielectric Phenomenon, CEIDP 2017 - Texas, United States
Duration: 2017 Oct 222017 Oct 25

Publication series

NameAnnual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
Volume2017-October
ISSN (Print)0084-9162

Other

Other2017 IEEE Conference on Electrical Insulation and Dielectric Phenomenon, CEIDP 2017
CountryUnited States
CityTexas
Period17/10/2217/10/25

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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    Lee, C. K., Chang, S. J., Jung, M. K., & Shin, Y. J. (2018). Condition monitoring of cable aging via time-frequency domain reflectometry in real-Time. In CEIDP 2017 - IEEE Conference on Electrical Insulation and Dielectric Phenomenon (pp. 290-294). (Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP; Vol. 2017-October). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CEIDP.2017.8257585