Contact resistance dependent scaling-down behavior of amorphous InGaZnO thin-film transistors

Edward Namkyu Cho, Jung Han Kang, Ilgu Yun

Research output: Contribution to journalArticle

28 Citations (Scopus)

Abstract

Here, we report scaling effects on the electrical properties of amorphous InGaZnO (a-IGZO) thin-film transistors (TFTs). The a-IGZO TFTs had same channel width/length ratio (W/L = 20), but different channel lengths (L = 20, 10, 5, and 2.5 μm). To examine the scaling-down behaviors, short-channel effects and contact resistance of the TFTs were investigated. As the channel length decreased, apparent shift of threshold voltage (Vth) and degradation of subthreshold swing (SSUB) were shown. In addition, it is also found that the field-effect mobility (μFE) was degraded as the channel length was decreased which was originated from contact resistance. Due to this contact resistance effect, drain current (IDS) was decreased for short-channel devices.

Original languageEnglish
Pages (from-to)1015-1019
Number of pages5
JournalCurrent Applied Physics
Volume11
Issue number4
DOIs
Publication statusPublished - 2011 Jul 1

Fingerprint

Amorphous films
Thin film transistors
Contact resistance
contact resistance
transistors
scaling
thin films
Drain current
Threshold voltage
Electric properties
Degradation
threshold voltage
electrical properties
degradation
shift

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Physics and Astronomy(all)

Cite this

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abstract = "Here, we report scaling effects on the electrical properties of amorphous InGaZnO (a-IGZO) thin-film transistors (TFTs). The a-IGZO TFTs had same channel width/length ratio (W/L = 20), but different channel lengths (L = 20, 10, 5, and 2.5 μm). To examine the scaling-down behaviors, short-channel effects and contact resistance of the TFTs were investigated. As the channel length decreased, apparent shift of threshold voltage (Vth) and degradation of subthreshold swing (SSUB) were shown. In addition, it is also found that the field-effect mobility (μFE) was degraded as the channel length was decreased which was originated from contact resistance. Due to this contact resistance effect, drain current (IDS) was decreased for short-channel devices.",
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Contact resistance dependent scaling-down behavior of amorphous InGaZnO thin-film transistors. / Cho, Edward Namkyu; Kang, Jung Han; Yun, Ilgu.

In: Current Applied Physics, Vol. 11, No. 4, 01.07.2011, p. 1015-1019.

Research output: Contribution to journalArticle

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