Convolutional Neural Network for Wafer Surface Defect Classification and the Detection of Unknown Defect Class

Computer Science

• Classification 100%
• Classification Method 42%
• Convolutional Neural Network 42%
• Convolutional Neural Network 42%
• Algorithms 14%
• Pattern Classification 14%
• Classification Performance 14%
• Detection Performance 14%
• Machine Learning Technique 14%
• Neural Network Model 14%
• Microscope Image 14%

Social Sciences

• Neural Network 100%
• Classification Systems 66%
• Algorithms 33%
• Electrons 33%
• Microscope 33%

Psychology

• Neural Network 100%
• Network Model 33%