Correction of spectral deformation by second-order diffraction overlap in a mid-infrared range grating spectrometer using a PbSe array detector

Wondong Lee, Hyungwoo Lee, Jae Won Hahn

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

Conventional diffraction gratings suffer from order overlap problems, especially for a mid-infrared optical emission spectrometer (mid-IR OES) using a detector array. Because of diffraction order overlap, ambiguous spectroscopic data are inevitably acquired. This shortcoming motivated us to devise an order-sorting method. We predicted a second-order diffraction overlap and corrected the deformation of signal measured with a mid-IR OES using an array detector. It is found that the first-order signal separated from the overlapped spectrum fit well with the intrinsic signal of incident light. We determined the system response function of a mid-IR OES and confirmed the validity of the compensation method by comparing the measured spectrum with Planck's curve of blackbody radiation at two different temperatures. In addition, for accuracy verification, the uncertainty factors that could affect the compensation procedures were carefully considered.

Original languageEnglish
Pages (from-to)327-332
Number of pages6
JournalInfrared Physics and Technology
Volume67
DOIs
Publication statusPublished - 2014 Jan 1

Fingerprint

Diffraction gratings
light emission
Spectrometers
Diffraction
gratings
spectrometers
Infrared radiation
Detectors
detectors
diffraction
gratings (spectra)
classifying
Sorting
Radiation
curves
radiation
lead selenide
Temperature
temperature
Compensation and Redress

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics

Cite this

@article{3378b733b840472696078f7d717522ee,
title = "Correction of spectral deformation by second-order diffraction overlap in a mid-infrared range grating spectrometer using a PbSe array detector",
abstract = "Conventional diffraction gratings suffer from order overlap problems, especially for a mid-infrared optical emission spectrometer (mid-IR OES) using a detector array. Because of diffraction order overlap, ambiguous spectroscopic data are inevitably acquired. This shortcoming motivated us to devise an order-sorting method. We predicted a second-order diffraction overlap and corrected the deformation of signal measured with a mid-IR OES using an array detector. It is found that the first-order signal separated from the overlapped spectrum fit well with the intrinsic signal of incident light. We determined the system response function of a mid-IR OES and confirmed the validity of the compensation method by comparing the measured spectrum with Planck's curve of blackbody radiation at two different temperatures. In addition, for accuracy verification, the uncertainty factors that could affect the compensation procedures were carefully considered.",
author = "Wondong Lee and Hyungwoo Lee and Hahn, {Jae Won}",
year = "2014",
month = "1",
day = "1",
doi = "10.1016/j.infrared.2014.07.032",
language = "English",
volume = "67",
pages = "327--332",
journal = "Infrared Physics and Technology",
issn = "1350-4495",
publisher = "Elsevier",

}

TY - JOUR

T1 - Correction of spectral deformation by second-order diffraction overlap in a mid-infrared range grating spectrometer using a PbSe array detector

AU - Lee, Wondong

AU - Lee, Hyungwoo

AU - Hahn, Jae Won

PY - 2014/1/1

Y1 - 2014/1/1

N2 - Conventional diffraction gratings suffer from order overlap problems, especially for a mid-infrared optical emission spectrometer (mid-IR OES) using a detector array. Because of diffraction order overlap, ambiguous spectroscopic data are inevitably acquired. This shortcoming motivated us to devise an order-sorting method. We predicted a second-order diffraction overlap and corrected the deformation of signal measured with a mid-IR OES using an array detector. It is found that the first-order signal separated from the overlapped spectrum fit well with the intrinsic signal of incident light. We determined the system response function of a mid-IR OES and confirmed the validity of the compensation method by comparing the measured spectrum with Planck's curve of blackbody radiation at two different temperatures. In addition, for accuracy verification, the uncertainty factors that could affect the compensation procedures were carefully considered.

AB - Conventional diffraction gratings suffer from order overlap problems, especially for a mid-infrared optical emission spectrometer (mid-IR OES) using a detector array. Because of diffraction order overlap, ambiguous spectroscopic data are inevitably acquired. This shortcoming motivated us to devise an order-sorting method. We predicted a second-order diffraction overlap and corrected the deformation of signal measured with a mid-IR OES using an array detector. It is found that the first-order signal separated from the overlapped spectrum fit well with the intrinsic signal of incident light. We determined the system response function of a mid-IR OES and confirmed the validity of the compensation method by comparing the measured spectrum with Planck's curve of blackbody radiation at two different temperatures. In addition, for accuracy verification, the uncertainty factors that could affect the compensation procedures were carefully considered.

UR - http://www.scopus.com/inward/record.url?scp=84907515390&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84907515390&partnerID=8YFLogxK

U2 - 10.1016/j.infrared.2014.07.032

DO - 10.1016/j.infrared.2014.07.032

M3 - Article

AN - SCOPUS:84907515390

VL - 67

SP - 327

EP - 332

JO - Infrared Physics and Technology

JF - Infrared Physics and Technology

SN - 1350-4495

ER -