Abstract
Adv. Electron. Mater. 2020, 6, 2000479 https://doi.org/10.1002/aelm.202000479 This is an error in the acknowledgements of this manuscript. The correct acknowledgements are reproduced below. S.H. and K.L.K. contributed equally to this work. The authors acknowledge the financial support from the National Research Foundation of Korea (NRF) (NRL program: Grant No. 2017R1A2A1A05001278, SRC program: Grant No. 2017R1A5A1014862, vdWMRC center). The authors also acknowledge the financial support from NRF, funded by Korean government (MEST) (No. 2018M3D1A1058536). J.H.P. acknowledges this research was supported by Basic Science Research Program through NRF funded by the Ministry of Education (NRF-2019R1I1A1A01063644). S.H. acknowledges the tuition support from the Hyundai Motor Chung Mong-Koo Foundation.
Original language | English |
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Article number | 2000906 |
Journal | Advanced Electronic Materials |
Volume | 7 |
Issue number | 5 |
DOIs |
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Publication status | Published - 2021 May |
Bibliographical note
Funding Information:S.H. and K.L.K. contributed equally to this work. The authors acknowledge the financial support from the National Research Foundation of Korea (NRF) (NRL program: Grant No. 2017R1A2A1A05001278, SRC program: Grant No. 2017R1A5A1014862, vdWMRC center). The authors also acknowledge the financial support from NRF, funded by Korean government (MEST) (No. 2018M3D1A1058536). J.H.P. acknowledges this research was supported by Basic Science Research Program through NRF funded by the Ministry of Education (NRF‐2019R1I1A1A01063644). S.H. acknowledges the tuition support from the Hyundai Motor Chung Mong‐Koo Foundation.
Publisher Copyright:
© 2021 Wiley-VCH GmbH
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials