Correlation between the surface roughness and the leakage current of an SSB radiation detector

Han Soo Kim, Se Hwan Park, Yong Kyun Kim, Jang Ho Ha, Sang Mook Kang, Seung Yeon Cho

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

Leakage current is one of the main noise sources of in radiation detectors, especially in a semiconductor radiation detector used for energy spectroscopy. A Silicon Surface Barrier (SSB) radiation detector was constructed to study the correlation between its surface roughness and leakage current. The surface roughness was analyzed with an Atomic Force Microscopy (AFM). All the constructed SSB radiation detectors in this study were processed in same way, but the etching solutions used to roughen the silicon surface were different. The correlation coefficient between the surface roughness and the leakage current was 0.848. This value indicates that the surface roughness and the leakage current have a relatively strong relationship, and a proper etching condition can minimize the leakage current in a semiconductor radiation detector based on silicon. The energy spectrum for an alpha particle from 238Pu was also measured with the constructed SSB radiation detector.

Original languageEnglish
Pages (from-to)117-119
Number of pages3
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume579
Issue number1
DOIs
Publication statusPublished - 2007 Aug 21

Fingerprint

Radiation detectors
radiation detectors
Leakage currents
surface roughness
leakage
Surface roughness
Silicon
silicon
Semiconductor detectors
Etching
etching
Alpha particles
correlation coefficients
alpha particles
Atomic force microscopy
energy spectra
atomic force microscopy
Spectroscopy
spectroscopy

All Science Journal Classification (ASJC) codes

  • Nuclear and High Energy Physics
  • Instrumentation

Cite this

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abstract = "Leakage current is one of the main noise sources of in radiation detectors, especially in a semiconductor radiation detector used for energy spectroscopy. A Silicon Surface Barrier (SSB) radiation detector was constructed to study the correlation between its surface roughness and leakage current. The surface roughness was analyzed with an Atomic Force Microscopy (AFM). All the constructed SSB radiation detectors in this study were processed in same way, but the etching solutions used to roughen the silicon surface were different. The correlation coefficient between the surface roughness and the leakage current was 0.848. This value indicates that the surface roughness and the leakage current have a relatively strong relationship, and a proper etching condition can minimize the leakage current in a semiconductor radiation detector based on silicon. The energy spectrum for an alpha particle from 238Pu was also measured with the constructed SSB radiation detector.",
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Correlation between the surface roughness and the leakage current of an SSB radiation detector. / Kim, Han Soo; Park, Se Hwan; Kim, Yong Kyun; Ha, Jang Ho; Kang, Sang Mook; Cho, Seung Yeon.

In: Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 579, No. 1, 21.08.2007, p. 117-119.

Research output: Contribution to journalArticle

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AU - Park, Se Hwan

AU - Kim, Yong Kyun

AU - Ha, Jang Ho

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AU - Cho, Seung Yeon

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AB - Leakage current is one of the main noise sources of in radiation detectors, especially in a semiconductor radiation detector used for energy spectroscopy. A Silicon Surface Barrier (SSB) radiation detector was constructed to study the correlation between its surface roughness and leakage current. The surface roughness was analyzed with an Atomic Force Microscopy (AFM). All the constructed SSB radiation detectors in this study were processed in same way, but the etching solutions used to roughen the silicon surface were different. The correlation coefficient between the surface roughness and the leakage current was 0.848. This value indicates that the surface roughness and the leakage current have a relatively strong relationship, and a proper etching condition can minimize the leakage current in a semiconductor radiation detector based on silicon. The energy spectrum for an alpha particle from 238Pu was also measured with the constructed SSB radiation detector.

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