Crossed nanotube junctions

M. S. Fuhrer, J. Nygård, L. Shih, M. Forero, Young Gui Yoon, M. S.C. Mazzoni, Hyoung Joon Choi, Jisoon Ihm, Steven G. Louie, A. Zettl, Paul L. McEuen

Research output: Contribution to journalArticle

1063 Citations (Scopus)

Abstract

Junctions consisting of two crossed single-walled carbon nanotubes were fabricated with electrical contacts at each end of each nanotube. The individual nanotubes were identified as metallic (M) or semiconducting (S), based on their two-terminal conductances; MM, MS, and SS four-terminal devices were studied. The MM and SS junctions had high conductances, on the order of 0.1 e2/h (where e is the electron charge and h is Planck's constant). For an MS junction, the semiconducting nanotube was depleted at the junction by the metallic nanotube, forming a rectifying Schottky barrier. We used two- and three-terminal experiments to fully characterize this junction.

Original languageEnglish
Pages (from-to)494-497
Number of pages4
JournalScience
Volume288
Issue number5465
DOIs
Publication statusPublished - 2000 Apr 21

All Science Journal Classification (ASJC) codes

  • General

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    Fuhrer, M. S., Nygård, J., Shih, L., Forero, M., Yoon, Y. G., Mazzoni, M. S. C., Choi, H. J., Ihm, J., Louie, S. G., Zettl, A., & McEuen, P. L. (2000). Crossed nanotube junctions. Science, 288(5465), 494-497. https://doi.org/10.1126/science.288.5465.494