Crystallization and microstructural evolution of cordierite-based thick film dielectrics

Yong Soo Cho, D. T. Hoelzer, W. A. Schulze, V. R.W. Amarakoon

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

Microstructural evolution of glass-ceramic dielectric thick films based on a nonstoichiometric cordierite, 2.4MgO·2Al2O3·5SiO2, containing B2O3, P2O5, and PbO were investigated in conjunction with nucleation and crystal growth. The cordierite thick films were deposited by screen printing on a 96% alumina substrate, and then fired in the temperature range of 850-950°C in a N2 atmosphere. Surface microstructure characteristics of the thick films depended on PbO content. Heterogeneous nucleation originated predominantly from the interface between the densified thick film and the alumina substrate. The added PbO segregated to the remaining glass during crystallization, and the relative concentration of Pb in the glass was proven to increase with rising temperature. Most of the remaining glass protruded from the film surface at the final temperature of 950°C. Penetration of the alumina substrate by the remaining glass was also observed. The influences of temperature and PbO on the microstructural evolution including nucleation and growth will be discussed with possible explanations for the observed results.

Original languageEnglish
Pages (from-to)6421-6430
Number of pages10
JournalActa Materialia
Volume46
Issue number18
DOIs
Publication statusPublished - 1998 Jan 1

Fingerprint

Microstructural evolution
Crystallization
Thick films
Aluminum Oxide
Glass
phosphorus pentoxide
Nucleation
Alumina
Substrates
Temperature
Dielectric films
Screen printing
Glass ceramics
Crystal growth
Microstructure
cordierite

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Polymers and Plastics
  • Metals and Alloys

Cite this

Cho, Yong Soo ; Hoelzer, D. T. ; Schulze, W. A. ; Amarakoon, V. R.W. / Crystallization and microstructural evolution of cordierite-based thick film dielectrics. In: Acta Materialia. 1998 ; Vol. 46, No. 18. pp. 6421-6430.
@article{2f20260138c34c058c359e228f6e7fe2,
title = "Crystallization and microstructural evolution of cordierite-based thick film dielectrics",
abstract = "Microstructural evolution of glass-ceramic dielectric thick films based on a nonstoichiometric cordierite, 2.4MgO·2Al2O3·5SiO2, containing B2O3, P2O5, and PbO were investigated in conjunction with nucleation and crystal growth. The cordierite thick films were deposited by screen printing on a 96{\%} alumina substrate, and then fired in the temperature range of 850-950°C in a N2 atmosphere. Surface microstructure characteristics of the thick films depended on PbO content. Heterogeneous nucleation originated predominantly from the interface between the densified thick film and the alumina substrate. The added PbO segregated to the remaining glass during crystallization, and the relative concentration of Pb in the glass was proven to increase with rising temperature. Most of the remaining glass protruded from the film surface at the final temperature of 950°C. Penetration of the alumina substrate by the remaining glass was also observed. The influences of temperature and PbO on the microstructural evolution including nucleation and growth will be discussed with possible explanations for the observed results.",
author = "Cho, {Yong Soo} and Hoelzer, {D. T.} and Schulze, {W. A.} and Amarakoon, {V. R.W.}",
year = "1998",
month = "1",
day = "1",
doi = "10.1016/S1359-6454(98)00307-3",
language = "English",
volume = "46",
pages = "6421--6430",
journal = "Acta Materialia",
issn = "1359-6454",
publisher = "Elsevier Limited",
number = "18",

}

Crystallization and microstructural evolution of cordierite-based thick film dielectrics. / Cho, Yong Soo; Hoelzer, D. T.; Schulze, W. A.; Amarakoon, V. R.W.

In: Acta Materialia, Vol. 46, No. 18, 01.01.1998, p. 6421-6430.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Crystallization and microstructural evolution of cordierite-based thick film dielectrics

AU - Cho, Yong Soo

AU - Hoelzer, D. T.

AU - Schulze, W. A.

AU - Amarakoon, V. R.W.

PY - 1998/1/1

Y1 - 1998/1/1

N2 - Microstructural evolution of glass-ceramic dielectric thick films based on a nonstoichiometric cordierite, 2.4MgO·2Al2O3·5SiO2, containing B2O3, P2O5, and PbO were investigated in conjunction with nucleation and crystal growth. The cordierite thick films were deposited by screen printing on a 96% alumina substrate, and then fired in the temperature range of 850-950°C in a N2 atmosphere. Surface microstructure characteristics of the thick films depended on PbO content. Heterogeneous nucleation originated predominantly from the interface between the densified thick film and the alumina substrate. The added PbO segregated to the remaining glass during crystallization, and the relative concentration of Pb in the glass was proven to increase with rising temperature. Most of the remaining glass protruded from the film surface at the final temperature of 950°C. Penetration of the alumina substrate by the remaining glass was also observed. The influences of temperature and PbO on the microstructural evolution including nucleation and growth will be discussed with possible explanations for the observed results.

AB - Microstructural evolution of glass-ceramic dielectric thick films based on a nonstoichiometric cordierite, 2.4MgO·2Al2O3·5SiO2, containing B2O3, P2O5, and PbO were investigated in conjunction with nucleation and crystal growth. The cordierite thick films were deposited by screen printing on a 96% alumina substrate, and then fired in the temperature range of 850-950°C in a N2 atmosphere. Surface microstructure characteristics of the thick films depended on PbO content. Heterogeneous nucleation originated predominantly from the interface between the densified thick film and the alumina substrate. The added PbO segregated to the remaining glass during crystallization, and the relative concentration of Pb in the glass was proven to increase with rising temperature. Most of the remaining glass protruded from the film surface at the final temperature of 950°C. Penetration of the alumina substrate by the remaining glass was also observed. The influences of temperature and PbO on the microstructural evolution including nucleation and growth will be discussed with possible explanations for the observed results.

UR - http://www.scopus.com/inward/record.url?scp=0032203161&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0032203161&partnerID=8YFLogxK

U2 - 10.1016/S1359-6454(98)00307-3

DO - 10.1016/S1359-6454(98)00307-3

M3 - Article

VL - 46

SP - 6421

EP - 6430

JO - Acta Materialia

JF - Acta Materialia

SN - 1359-6454

IS - 18

ER -