Crystallographic and magnetic properties in CoAl0.2Fe1.8O4 thin films prepared by a sol-gel method

Sam Jin Kim, Kwang Ho Jeong, Chul Sung Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this study the growth of Al substituted Co ferrite thin films on thermally oxidized silicon substrates is introduced by a sol-gel method as an alternative to some of the other deposition techniques that have been used to grow Co ferrite thin films. The structural and magnetic properties studies are presented by using an X-ray diffractometer (XRD), thermogravimetry analysis (TGA), differential thermal analysis (DTA), a vibrating sample magnetometer (VSM) and atomic force microscopy (AFM) as a function of the annealing temperature.

Original languageEnglish
Title of host publicationINTERMAG Europe 2002 - IEEE International Magnetics Conference
EditorsJ. Fidler, B. Hillebrands, C. Ross, D. Weller, L. Folks, E. Hill, M. Vazquez Villalabeitia, J. A. Bain, Jo De Boeck, R. Wood
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)0780373650, 9780780373655
DOIs
Publication statusPublished - 2002
Event2002 IEEE International Magnetics Conference, INTERMAG Europe 2002 - Amsterdam, Netherlands
Duration: 2002 Apr 282002 May 2

Publication series

NameINTERMAG Europe 2002 - IEEE International Magnetics Conference

Other

Other2002 IEEE International Magnetics Conference, INTERMAG Europe 2002
CountryNetherlands
CityAmsterdam
Period02/4/2802/5/2

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering
  • Surfaces, Coatings and Films

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