Crystallographic and magnetic properties of CoAl 0.2 Fe 1.8 O 4 thin films prepared by a Sol-Gel method

Sam Jin Kim, KwangHo Jeong, Chul Sung Kim

Research output: Contribution to journalConference article

11 Citations (Scopus)

Abstract

Thin films of Al-substituted cobalt ferrite layers on thermally oxidized silicon wafers were fabricated via the sol-gel method with various annealing temperatures. Structural and magnetic properties of the films were investigated with thermogravimetric and differential thermal analysis (TG-DTA), an x-ray diffractometer, vibrating sample magnetometer (VSM), and atomic force microscopy (AFM). TG-DTA measurements showed exothermic reaction peak at 285° C. CoAl 0.2 Fe 1.8 O 4 thin films that fired at and above 400°C had a single cubic spinel structure without any preferred crystallite orientation. Lattice constants monotonically decreased from 0.8381 to 0.8354 nm with increasing annealing temperature from 400 to 800°C. As annealing temperature increased from 400 up to 800°C, grain size increased from 4.6 to 25.4 nm, whereas the surface roughness was minimized at 700°C with a value of 2.0 nm. Parallel and perpendicular coereivity at room temperature showed maximum values of 1980 and 2490 Oe, respectively, in the sample annealed at 700° C. Coercivity was shown to be strongly dependent not only on annealing temperature but also on surface roughness.

Original languageEnglish
Pages (from-to)2628-2630
Number of pages3
JournalIEEE Transactions on Magnetics
Volume38
Issue number5 I
DOIs
Publication statusPublished - 2002 Sep 1
Event2002 International Magnetics Conference (Intermag 2002) - Amsterdam, Netherlands
Duration: 2002 Apr 282002 May 2

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Coal
Sol-gel process
Magnetic properties
Thin films
Annealing
Differential thermal analysis
Temperature
Surface roughness
Exothermic reactions
Diffractometers
Magnetometers
Coercive force
Silicon wafers
Lattice constants
Ferrite
Structural properties
Cobalt
Atomic force microscopy
X rays

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Cite this

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title = "Crystallographic and magnetic properties of CoAl 0.2 Fe 1.8 O 4 thin films prepared by a Sol-Gel method",
abstract = "Thin films of Al-substituted cobalt ferrite layers on thermally oxidized silicon wafers were fabricated via the sol-gel method with various annealing temperatures. Structural and magnetic properties of the films were investigated with thermogravimetric and differential thermal analysis (TG-DTA), an x-ray diffractometer, vibrating sample magnetometer (VSM), and atomic force microscopy (AFM). TG-DTA measurements showed exothermic reaction peak at 285° C. CoAl 0.2 Fe 1.8 O 4 thin films that fired at and above 400°C had a single cubic spinel structure without any preferred crystallite orientation. Lattice constants monotonically decreased from 0.8381 to 0.8354 nm with increasing annealing temperature from 400 to 800°C. As annealing temperature increased from 400 up to 800°C, grain size increased from 4.6 to 25.4 nm, whereas the surface roughness was minimized at 700°C with a value of 2.0 nm. Parallel and perpendicular coereivity at room temperature showed maximum values of 1980 and 2490 Oe, respectively, in the sample annealed at 700° C. Coercivity was shown to be strongly dependent not only on annealing temperature but also on surface roughness.",
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Crystallographic and magnetic properties of CoAl 0.2 Fe 1.8 O 4 thin films prepared by a Sol-Gel method . / Kim, Sam Jin; Jeong, KwangHo; Kim, Chul Sung.

In: IEEE Transactions on Magnetics, Vol. 38, No. 5 I, 01.09.2002, p. 2628-2630.

Research output: Contribution to journalConference article

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N2 - Thin films of Al-substituted cobalt ferrite layers on thermally oxidized silicon wafers were fabricated via the sol-gel method with various annealing temperatures. Structural and magnetic properties of the films were investigated with thermogravimetric and differential thermal analysis (TG-DTA), an x-ray diffractometer, vibrating sample magnetometer (VSM), and atomic force microscopy (AFM). TG-DTA measurements showed exothermic reaction peak at 285° C. CoAl 0.2 Fe 1.8 O 4 thin films that fired at and above 400°C had a single cubic spinel structure without any preferred crystallite orientation. Lattice constants monotonically decreased from 0.8381 to 0.8354 nm with increasing annealing temperature from 400 to 800°C. As annealing temperature increased from 400 up to 800°C, grain size increased from 4.6 to 25.4 nm, whereas the surface roughness was minimized at 700°C with a value of 2.0 nm. Parallel and perpendicular coereivity at room temperature showed maximum values of 1980 and 2490 Oe, respectively, in the sample annealed at 700° C. Coercivity was shown to be strongly dependent not only on annealing temperature but also on surface roughness.

AB - Thin films of Al-substituted cobalt ferrite layers on thermally oxidized silicon wafers were fabricated via the sol-gel method with various annealing temperatures. Structural and magnetic properties of the films were investigated with thermogravimetric and differential thermal analysis (TG-DTA), an x-ray diffractometer, vibrating sample magnetometer (VSM), and atomic force microscopy (AFM). TG-DTA measurements showed exothermic reaction peak at 285° C. CoAl 0.2 Fe 1.8 O 4 thin films that fired at and above 400°C had a single cubic spinel structure without any preferred crystallite orientation. Lattice constants monotonically decreased from 0.8381 to 0.8354 nm with increasing annealing temperature from 400 to 800°C. As annealing temperature increased from 400 up to 800°C, grain size increased from 4.6 to 25.4 nm, whereas the surface roughness was minimized at 700°C with a value of 2.0 nm. Parallel and perpendicular coereivity at room temperature showed maximum values of 1980 and 2490 Oe, respectively, in the sample annealed at 700° C. Coercivity was shown to be strongly dependent not only on annealing temperature but also on surface roughness.

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