Current-lead design for cryocooled HTS fault current limiters

Ho Myung Chang, Yun Sik Kim, Ho Min Kim, Haigun Lee, Tae Kuk Ko

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

A comprehensive design procedure is presented for the current leads in HTS fault current limiters continuously refrigerated by a cryocooler. Two specific aspects are focused here in addition to the standard lead-design. The first is an optimization with taking into account the heat conduction through electrical insulator needed for high-voltage applications. Through a rigorous analysis, it is verified that the standard design should be modified in order to minimize the overall heat leak. The second is the transient thermal behavior that may be caused by excessive current. A numerical analysis is performed to estimate the peak temperature after a short current-limiting period, including the effect of fins as enhanced local heat capacity. Some of the design details are demonstrated for the specifications of FCL's under development in Korean R&D Programs.

Original languageEnglish
Pages (from-to)2244-2247
Number of pages4
JournalIEEE Transactions on Applied Superconductivity
Volume17
Issue number2
DOIs
Publication statusPublished - 2007 Jun 1

Fingerprint

Fault current limiters
Lead
fins
Heat conduction
conductive heat transfer
Specific heat
numerical analysis
Numerical analysis
specifications
high voltages
insulators
specific heat
Specifications
heat
optimization
Electric potential
estimates
Temperature
temperature
Hot Temperature

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Cite this

Chang, Ho Myung ; Kim, Yun Sik ; Kim, Ho Min ; Lee, Haigun ; Ko, Tae Kuk. / Current-lead design for cryocooled HTS fault current limiters. In: IEEE Transactions on Applied Superconductivity. 2007 ; Vol. 17, No. 2. pp. 2244-2247.
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Current-lead design for cryocooled HTS fault current limiters. / Chang, Ho Myung; Kim, Yun Sik; Kim, Ho Min; Lee, Haigun; Ko, Tae Kuk.

In: IEEE Transactions on Applied Superconductivity, Vol. 17, No. 2, 01.06.2007, p. 2244-2247.

Research output: Contribution to journalArticle

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