DC critical current test method for 22.9 kV/50 MVA superconducting power cable considering the uncertainty

Sukjin Choi, Sangjin Lee, Kideok Sim, Jeonwook Cho, Soogil Lee, Sang Geun Lee, Kyu Won Lee, Sang Young Lee, Dong Ho Kim, Tae Kuk Ko

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)

Abstract

In Korea, the superconducting power cable has been developed since 2001, with the basic specifications of 22.9 kV/50 MVA. The superconducting power cable can carry more than 2 to 5 times higher electric power compared with conventional ones. It is important to test the DC critical current related with its power capacity before applying to the real power grid. In 1995, several international standards organizations including IEC, decided to unify the use of statistical terms related with accuracy or precision in their standards. It was decided to use the word uncertainty for all quantitative (associated with a number) statistical expressions. In this paper, we measured DC critical current of 22.9 kV/50 MVA superconducting power cable with several voltage tap and analyzed the uncertainty with these results. These analyzed results can be applied the standardization of the superconducting power cable

Original languageEnglish
Article number5433246
Pages (from-to)1272-1275
Number of pages4
JournalIEEE Transactions on Applied Superconductivity
Volume20
Issue number3
DOIs
Publication statusPublished - 2010 Jun

Bibliographical note

Funding Information:
Manuscript received October 20, 2009. First published March 18, 2010; current version published May 28, 2010. This research was supported by a Grant from Center for Applied Superconductivity Technology of the 21st Century Frontier R&D Program funded by the Ministry of Education, Science and Technology, Republic of Korea. S. Choi and T. K. Ko are with Yonsei University, Seoul 120-749, Korea (e-mail: sjchoi94@yonsei.ac.kr). Sangjin Lee is with Uiduk University, Gyeongju 780-713, Korea (e-mail: sjlee@uu.ac.kr). K. Sim and J. Cho are with the Korea Electrotechnology Research Institute, Changwon 641-120, Korea (e-mail: skedy@keri.re.kr). Soogil Lee is with the LS Cable, Korea (e-mail: sglee@lscable.com). Sang-Geun Lee is with the Korean Agency for Technology and Standards (KATS), Gwacheon 427-723, Korea (e-mail: sglee@kats.go.kr). K. W. Lee is with the Korea Research Institute of Standard and Science, Taejon 305-340, Korea (e-mail: leekw@kriss.re.kr). Sang Young Lee is with Konkuk University, Seoul 143-701, Korea (e-mail: sylee@konkuk.ac.kr). D. H. Kim is with the Yeungnam University, Gyeongsan 712-749, Korea (e-mail: dhkim@ynu.ac.kr). Color versions of one or more of the figures in this paper are available online at http://ieeexplore.ieee.org. Digital Object Identifier 10.1109/TASC.2010.2043519

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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