DC versus pulse-type negative bias stress effects on the instability of amorphous ingazno transistors under light illumination

Youn Gyoung Chang, Tae Woong Moon, Dae Hwan Kim, Hee Sung Lee, Jae Hoon Kim, Kwon Shik Park, Chang Dong Kim, Seongil Im

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20 Citations (Scopus)

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Chemical Compounds

Engineering & Materials Science