Dechlorination and crystallization of solution-processed zinc tin oxide thin film transistor with various annealing temperature

Jeong Soo Lee, Sung Hwan Choi, Seung Hee Kuk, Moon Kyu Song, Yong Hoon Kim, Jang Yeon Kwon, Min Koo Han

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We investigated solution-processed zinc tin oxide (ZTO) thin film transistors (TFTs) with various annehaling temperature. When the annealing temperature increased from 300°C to 500°C, ZTO film was dechlorinated and nano-crystallized, and saturation mobility of solution-processed ZTO thin film transistor increased from 0.18 cm2/V·sec to 2.15 cm 2/V·sec.

Original languageEnglish
Title of host publicationSociety for Information Display - 18th International Display Workshops 2011, IDW'11
Pages1685-1688
Number of pages4
Publication statusPublished - 2011 Dec 1
Event18th International Display Workshops 2011, IDW 2011 - Nagoya, Japan
Duration: 2011 Dec 72011 Dec 9

Publication series

NameProceedings of the International Display Workshops
Volume3
ISSN (Print)1883-2490

Other

Other18th International Display Workshops 2011, IDW 2011
CountryJapan
CityNagoya
Period11/12/711/12/9

All Science Journal Classification (ASJC) codes

  • Computer Vision and Pattern Recognition
  • Human-Computer Interaction
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Radiology Nuclear Medicine and imaging

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    Lee, J. S., Choi, S. H., Kuk, S. H., Song, M. K., Kim, Y. H., Kwon, J. Y., & Han, M. K. (2011). Dechlorination and crystallization of solution-processed zinc tin oxide thin film transistor with various annealing temperature. In Society for Information Display - 18th International Display Workshops 2011, IDW'11 (pp. 1685-1688). (Proceedings of the International Display Workshops; Vol. 3).