Engineering & Materials Science
Phosphorus
100%
Silicon
65%
Substrates
58%
Defects
56%
X-Ray Emission Spectrometry
30%
Field effect transistors
25%
Atoms
24%
High resolution transmission electron microscopy
19%
Stacking faults
16%
Gates (transistor)
16%
Chemical vapor deposition
13%
Diamonds
11%
Tomography
11%
Physical properties
10%
Physics & Astronomy
phosphorus
80%
defects
45%
silicon
44%
field effect transistors
18%
fins
14%
silicon films
12%
spectroscopy
12%
atoms
11%
crystal defects
11%
x rays
10%
electric contacts
10%
diamonds
9%
tomography
9%
physical properties
9%
vapor deposition
9%
transmission electron microscopy
7%
electrical resistivity
7%
high resolution
7%
probes
7%
energy
6%
Chemistry
Field Effect
41%
Liquid Film
39%
Energy Dispersive X-Ray Spectroscopy
39%
Stacking Fault
28%
Phosphorus Atom
23%
Chemical Vapour Deposition
18%
Molecular Cluster
13%
Surface
13%
Probe
12%
Pressure
11%