Defect vs. Nanocrystal luminescence emitted in Si--implanted SiO2 Layer

J. Y. Jeong, Seongil Im, M. S. Oh, H. B. Kim, K. H. Chae, C. N. Whang, J. H. Song

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationDigest of Papers - Microprocesses and Nanotechnology 1998
Subtitle of host publication1998 International Microprocesses and Nanotechnology Conference
EditorsHyung Joon Yoo, Shinji Okazaki, Jinho Ahn, Ohyun Kim, Masanori Komuro
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages305-306
Number of pages2
ISBN (Electronic)4930813832, 9784930813831
DOIs
Publication statusPublished - 1998 Jan 1
Event1998 International Microprocesses and Nanotechnology Conference, MNC 1998 - Kyoungju, Korea, Republic of
Duration: 1998 Jul 131998 Jul 16

Publication series

NameDigest of Papers - Microprocesses and Nanotechnology 1998: 1998 International Microprocesses and Nanotechnology Conference
Volume1998-July

Conference

Conference1998 International Microprocesses and Nanotechnology Conference, MNC 1998
CountryKorea, Republic of
CityKyoungju
Period98/7/1398/7/16

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Nanocrystals
Luminescence
Defects

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Nuclear and High Energy Physics
  • Computer Science Applications

Cite this

Jeong, J. Y., Im, S., Oh, M. S., Kim, H. B., Chae, K. H., Whang, C. N., & Song, J. H. (1998). Defect vs. Nanocrystal luminescence emitted in Si--implanted SiO2 Layer. In H. J. Yoo, S. Okazaki, J. Ahn, O. Kim, & M. Komuro (Eds.), Digest of Papers - Microprocesses and Nanotechnology 1998: 1998 International Microprocesses and Nanotechnology Conference (pp. 305-306). [730094] (Digest of Papers - Microprocesses and Nanotechnology 1998: 1998 International Microprocesses and Nanotechnology Conference; Vol. 1998-July). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IMNC.1998.730094
Jeong, J. Y. ; Im, Seongil ; Oh, M. S. ; Kim, H. B. ; Chae, K. H. ; Whang, C. N. ; Song, J. H. / Defect vs. Nanocrystal luminescence emitted in Si--implanted SiO2 Layer. Digest of Papers - Microprocesses and Nanotechnology 1998: 1998 International Microprocesses and Nanotechnology Conference. editor / Hyung Joon Yoo ; Shinji Okazaki ; Jinho Ahn ; Ohyun Kim ; Masanori Komuro. Institute of Electrical and Electronics Engineers Inc., 1998. pp. 305-306 (Digest of Papers - Microprocesses and Nanotechnology 1998: 1998 International Microprocesses and Nanotechnology Conference).
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Jeong, JY, Im, S, Oh, MS, Kim, HB, Chae, KH, Whang, CN & Song, JH 1998, Defect vs. Nanocrystal luminescence emitted in Si--implanted SiO2 Layer. in HJ Yoo, S Okazaki, J Ahn, O Kim & M Komuro (eds), Digest of Papers - Microprocesses and Nanotechnology 1998: 1998 International Microprocesses and Nanotechnology Conference., 730094, Digest of Papers - Microprocesses and Nanotechnology 1998: 1998 International Microprocesses and Nanotechnology Conference, vol. 1998-July, Institute of Electrical and Electronics Engineers Inc., pp. 305-306, 1998 International Microprocesses and Nanotechnology Conference, MNC 1998, Kyoungju, Korea, Republic of, 98/7/13. https://doi.org/10.1109/IMNC.1998.730094

Defect vs. Nanocrystal luminescence emitted in Si--implanted SiO2 Layer. / Jeong, J. Y.; Im, Seongil; Oh, M. S.; Kim, H. B.; Chae, K. H.; Whang, C. N.; Song, J. H.

Digest of Papers - Microprocesses and Nanotechnology 1998: 1998 International Microprocesses and Nanotechnology Conference. ed. / Hyung Joon Yoo; Shinji Okazaki; Jinho Ahn; Ohyun Kim; Masanori Komuro. Institute of Electrical and Electronics Engineers Inc., 1998. p. 305-306 730094 (Digest of Papers - Microprocesses and Nanotechnology 1998: 1998 International Microprocesses and Nanotechnology Conference; Vol. 1998-July).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

TY - GEN

T1 - Defect vs. Nanocrystal luminescence emitted in Si--implanted SiO2 Layer

AU - Jeong, J. Y.

AU - Im, Seongil

AU - Oh, M. S.

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AU - Chae, K. H.

AU - Whang, C. N.

AU - Song, J. H.

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DO - 10.1109/IMNC.1998.730094

M3 - Conference contribution

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T3 - Digest of Papers - Microprocesses and Nanotechnology 1998: 1998 International Microprocesses and Nanotechnology Conference

SP - 305

EP - 306

BT - Digest of Papers - Microprocesses and Nanotechnology 1998

A2 - Yoo, Hyung Joon

A2 - Okazaki, Shinji

A2 - Ahn, Jinho

A2 - Kim, Ohyun

A2 - Komuro, Masanori

PB - Institute of Electrical and Electronics Engineers Inc.

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Jeong JY, Im S, Oh MS, Kim HB, Chae KH, Whang CN et al. Defect vs. Nanocrystal luminescence emitted in Si--implanted SiO2 Layer. In Yoo HJ, Okazaki S, Ahn J, Kim O, Komuro M, editors, Digest of Papers - Microprocesses and Nanotechnology 1998: 1998 International Microprocesses and Nanotechnology Conference. Institute of Electrical and Electronics Engineers Inc. 1998. p. 305-306. 730094. (Digest of Papers - Microprocesses and Nanotechnology 1998: 1998 International Microprocesses and Nanotechnology Conference). https://doi.org/10.1109/IMNC.1998.730094