Defects in GaAs bulk crystals and multi-layers caused by in diffusion

P. Werner, Z. Liliental-Weber, H. Sohn, Wai Fan Yau, J. Baranowski, E. R. Weber

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationMaterials Research Society Symposium Proceedings
PublisherPubl by Materials Research Society
Pages487-491
Number of pages5
ISBN (Print)1558992057, 9781558992054
DOIs
Publication statusPublished - 1993
EventProceedings of the Symposium on Materials Reliability in Microelectronics III - San Francisco, CA, USA
Duration: 1993 Apr 121993 Apr 15

Publication series

NameMaterials Research Society Symposium Proceedings
Volume309
ISSN (Print)0272-9172

Other

OtherProceedings of the Symposium on Materials Reliability in Microelectronics III
CitySan Francisco, CA, USA
Period93/4/1293/4/15

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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