Defects in MOFs: A thorough characterization

Petko St. Petkov, Georgi N. Vayssilov, Jinxuan Liu, Osama Shekhah, Yuemin Wang, Christof Wöll, Thomas Heine

Research output: Contribution to journalArticle

75 Citations (Scopus)

Abstract

As indicated by nearly perfect XRD data, but challenged by a two-signal IR spectrum of CO guest molecules, it is confirmed by computer simulations and XPS experiments that the most defect-free SURMOFs contain about 4 % defective Cu sites.

Original languageEnglish
Pages (from-to)2025-2029
Number of pages5
JournalChemPhysChem
Volume13
Issue number8
DOIs
Publication statusPublished - 2012 Jun 4

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics
  • Physical and Theoretical Chemistry

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    St. Petkov, P., Vayssilov, G. N., Liu, J., Shekhah, O., Wang, Y., Wöll, C., & Heine, T. (2012). Defects in MOFs: A thorough characterization. ChemPhysChem, 13(8), 2025-2029. https://doi.org/10.1002/cphc.201200222